MiniSIMS ToF time-of-flight secondary ion mass spectrometer

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is currently one of the most informative techniques in the field of surface analysis. It uses a pulsed ion beam to bombard the surface of the sample, splashing out secondary ions, and accurately measuring the ion mass through a time-of-flight mass analyzer. This technology can simultaneously obtain elemental, isotopic, and molecular structure information of the outermost layer (sub nanometer depth) of the sample, and can achieve imaging analysis from micrometer to millimeter level regions, as well as composition distribution in the depth direction (depth analysis). Unlike conventional elemental analysis methods, ToF-SIMS has excellent detection capabilities for both organic and inorganic substances, making it particularly suitable for scenarios such as unknown substance identification, surface modification research, failure analysis, and nanofilm characterization.

MiniSIMS ToF time-of-flight secondary ion mass spectrometerIt is a desktop secondary ion mass spectrometer that has won multiple international awards such as the R&D 100 Award, innovatively developed by SAI company. It will integrate the SIMS capability that traditionally requires a large ultra-high vacuum system into a desktop device, with extremely low requirements for laboratory space and supporting facilities. The detection cost of a single sample can be reduced by up to 90% compared to traditional equipment.

Compared to traditional quadrupole SIMS, ToF analyzer has natural advantages in speed, information content, and unknown object discovery capability. And MiniSIMS ToF further presents this * capability in a desktop, low-cost form, allowing more laboratories and industrial users to afford and benefit from true SIMS analysis.

MiniSIMS ToF time-of-flight secondary ion mass spectrometerCore advantages:

1. One machine has multiple functions
Supports three working modes: static SIMS (surface single-molecule layer analysis), imaging SIMS (spatial distribution visualization), and dynamic SIMS (depth analysis), covering a wide range of needs from scientific research to industrial failure analysis.

2. Time of Flight Mass Analyzer
Using ToF technology to achieve quasi parallel detection, all quality numbers are collected simultaneously. Each spectrum, pixel, or depth layer contains complete mass spectrometry information, and the data can still be traced back after analysis without missing any unknown components.

3. Desktop compact design
The whole machine occupies an area of less than 0.5 square meters and weighs only about 60 kilograms. It can be easily installed on a regular laboratory bench without the need for special water cooling or high-power power supply.

4. Quick Start and High Throughput
It only takes a few minutes from the atmosphere to the working vacuum, and with efficient data collection capabilities, it significantly improves daily analysis efficiency, especially suitable for screening multiple batches of samples.

5. Unknown object recognition ability
For failure analysis and cutting-edge research, the discovery of unknown components is often a breakthrough. MiniSIMS ToF, with its full spectrum acquisition characteristics, is a powerful tool for discovering and identifying unknown contaminants, residues, additives, or degradation products.

Typical application areas

Electronic components: analysis of solder pad contamination, identification of surface residues

Surface coating: coating uniformity, interlayer interface analysis

Sensor: Chemical state characterization of sensitive material surface

Tribology: lubricant migration, wear surface analysis

Catalyst: Distribution of active components and investigation of deactivation reasons

Adhesive and film: Adhesive interface chemistry, ultra-thin film composition

Biomaterials: Evaluation of Surface Modification of Medical Devices

Corrosion and Protection: Identification of Corrosion Products and Analysis of Passivation Films

Education: Surface Analysis Teaching and Demonstration

Storage devices: Surface contamination control of magnetic heads/disks