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Micro vacuum probe station

NegotiableUpdate on 02/02
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Overview
Characterization of electrical properties of dielectric/piezoelectric/ferroelectric/pyroelectric/optoelectronic materials for Mini CPS micro vacuum probe station, with mechanical elastic design to avoid probe damage to thin film samples.
Product Details

Mini CPSMicro vacuum probe stationFeatures

1. Electrical characterization of dielectric/piezoelectric/ferroelectric/pyroelectric/optoelectronic materials

2. Mechanical elastic design to avoid probe damage to thin film samples

3. Can be measured in a vacuum or atmospheric environment

4. Compact and precise, with exquisite appearance

5.1000X microscopic magnification, conducive to real-time observation of sample status

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Mini CPSMicro vacuum probe stationTechnical Specifications

Temperature range:

-160℃~450℃

Temperature control accuracy:

±0.5℃

Heating rate:

0~10℃/min

Cooling method:

Electroacoustic refrigeration or liquid nitrogen refrigeration

Sample stand:

40×40 mm

Sample size:

φ <22 mm

Temperature measurement:

PT100

Probe arm:

4 of them

Cooling time:

30 minutes to cool down to -160 ℃

X-axis:

Travel ± 5mm, accuracy ± 0.01mm

Observation window:

φ26 mm

Y-axis:

Travel ± 5mm, accuracy ± 0.01mm

Displacement resolution:

10μm

Z-axis:

Travel ± 5mm, accuracy ± 0.01mm