- Phone
-
Address
No. 5500 Yuanjiang Road, Minhang District, Shanghai
Shanghai Maikewei Semiconductor Technology Co., Ltd
No. 5500 Yuanjiang Road, Minhang District, Shanghai
The CRX-6.5K combines the convenience of operating without liquid helium with the reliability of Lake Shore products, providing users with a low-cost and universal solution. It uses an independent closed-loop refrigeration system that can cool to low temperatures without human assistance after startup. Its versatility and affordability make the CRX-6.5K the preferred tool for many researchers around the world.
I-V, C-V, and microwave measurements are standard at CRX-6.5K. A two-stage closed-loop refrigeration machine allows the sample to maintain a high temperature during the cooling process, reducing the possibility of sample condensation, which is a key requirement for measuring organic materials.
The CRX-6.5K can operate within a temperature range of 8 K to 350 K and can be optionally extended to a high temperature range of 20 K to 675 K. This system can accommodate complete and partial wafers with a diameter of up to 51 mm (2 in). The wide selection of probes, test cables, sample holders, and options enables it to meet a variety of specific measurement applications.
Equipment parameters:
| temperature range | |
| Install 2 probe arms | Basic temperature 8 K, control range 8.5 K~350 K |
| Install 4 probe arms | Basic temperature 9 K, control range 9.5 K~350 K |
| Install 6 probe arms | Basic temperature 10 K, control range 10.5 K~350 K |
| Install PS-HTSTAGE option (incompatible with sample back bias) | Basic temperature 20 K, control range 20 K~675 K |
| temperature stability | |
| Basic temperature (without heating control) | not specified |
| <10 K | ±25 mK |
| 11 K ~ 350 K | ±10 mK |
| 351 K ~ 675 K | ±50 mK |
| vacuum | |
| room temperature | <5×10-4Back |
| Basal temperature | <1×10-5Back |
| maximum temperature | <5×10-5Back |
| cycle time | |
| Total cycle | 6.25 h |
| evacuate | 0.5 h |
| Probe station cooling | 3.5 h |
| Probe station temperature rise | 2.25 h |
| sample | |
| Maximum size | 51 mm (2 inches) |
| Sample backlight interface | Not selectable |
| Sample rotation | Not selectable |
| Sample vibration | <2 μm |
| Probe configuration | |
| Maximum number of probes | 6 |
| Probe arm thermometer | Used to monitor the temperature of the probe arm |
| Cooling probe bracket | <20 K (sample at base temperature) |
| Probe bracket | Connect the sample stage heat sink |
| Probe arm bracket | Connect the anti radiation screen heat sink |
| DC/RF probe | Electrical insulation>100G Ω for low leakage current measurement |
| Microwave probe | Frequency range from DC to 67GHz |
| Fiber optic probe | Can be used for electro-optical measurement |
| Needle drop range | All probes can be inserted into a circle with a diameter of 25.4 millimeters (1 inch) |