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Shanghai Maikewei Semiconductor Technology Co., Ltd

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    No. 5500 Yuanjiang Road, Minhang District, Shanghai

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Low temperature probe station without liquid helium/4 inches

NegotiableUpdate on 05/07
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Overview

The CRX-6.5K combines the convenience of operating without liquid helium with the reliability of Lake Shore products, providing users with a low-cost and universal solution.

Product Details

The CRX-6.5K combines the convenience of operating without liquid helium with the reliability of Lake Shore products, providing users with a low-cost and universal solution. It uses an independent closed-loop refrigeration system that can cool to low temperatures without human assistance after startup. Its versatility and affordability make the CRX-6.5K the preferred tool for many researchers around the world.

I-V, C-V, and microwave measurements are standard at CRX-6.5K. A two-stage closed-loop refrigeration machine allows the sample to maintain a high temperature during the cooling process, reducing the possibility of sample condensation, which is a key requirement for measuring organic materials.

The CRX-6.5K can operate within a temperature range of 8 K to 350 K and can be optionally extended to a high temperature range of 20 K to 675 K. This system can accommodate complete and partial wafers with a diameter of up to 51 mm (2 in). The wide selection of probes, test cables, sample holders, and options enables it to meet a variety of specific measurement applications.


Equipment parameters:


temperature range
Install 2 probe arms Basic temperature 8 K, control range 8.5 K~350 K
Install 4 probe arms Basic temperature 9 K, control range 9.5 K~350 K
Install 6 probe arms Basic temperature 10 K, control range 10.5 K~350 K
Install PS-HTSTAGE option (incompatible with sample back bias) Basic temperature 20 K, control range 20 K~675 K
temperature stability
Basic temperature (without heating control) not specified
<10 K ±25 mK
11 K ~ 350 K ±10 mK
351 K ~ 675 K ±50 mK
vacuum
room temperature <5×10-4Back
Basal temperature <1×10-5Back
maximum temperature <5×10-5Back
cycle time
Total cycle 6.25 h
evacuate 0.5 h
Probe station cooling 3.5 h
Probe station temperature rise 2.25 h
sample
Maximum size 51 mm (2 inches)
Sample backlight interface Not selectable
Sample rotation Not selectable
Sample vibration <2 μm
Probe configuration
Maximum number of probes 6
Probe arm thermometer Used to monitor the temperature of the probe arm
Cooling probe bracket <20 K (sample at base temperature)
Probe bracket Connect the sample stage heat sink
Probe arm bracket Connect the anti radiation screen heat sink
DC/RF probe Electrical insulation>100G Ω for low leakage current measurement
Microwave probe Frequency range from DC to 67GHz
Fiber optic probe Can be used for electro-optical measurement
Needle drop range All probes can be inserted into a circle with a diameter of 25.4 millimeters (1 inch)