Labsphere Fabric Sunscreen Index Analyzer from the United States

UV-2000F Fabric Sunscreen Index Analyzer

Professional equipment and improved functionality*

UV-2000F provided by Lanfei OpticsThe fabric sun protection index analyzer integrates new electronic components and software technology into an industry recognized system architecture to obtain accurate UPF of textilesValue, critical wavelength, and UVA: UVB (long wave ultraviolet: short wave ultraviolet) ratio. Driven by the rapid development of industrial demand, in order to simplify the research and quality control of textile samples, UV-2000F is designed and developed according to internationally recognized testing methods, such as AS/NZ 4399:19961, EN 13758-1:2001 AATCC TM 183-2000, and GB/T18830. UV-2000F replaces UV-1000F as a new choice in the industry, not only for laboratory UPF analysis, but also for basic quality control of products.

UV-2000FWe have made many improvements, including a new diode array spectrometer, scintillation xenon lamp, optical coupling fiber, optical head positioning structure, sample positioning platform, and a new and stable software development platform, thus establishing new industry standards.

The new diode array spectrometer has stable performance, and a specially customized concave diffraction optical system is used to ensure measurement integrity and good repeatability. Adopting a novel holographic diffraction grating, abandoning the traditional method of replicating gratings, ensures high efficiency within the wavelength range, and a longer pixel array ensures better pixel wavelength resolution. The illumination inside the integrating sphere is filtered through a filter, which limits the total exposure time of the sample and improves the stray light performance.

快速、高精度、高效率、5秒快速测量

UV-2000FFabric Sunscreen Index AnalyzerCapable of quickly measuring 250-450 nmDiffuse transmittance of textile samples in the ultraviolet band. Spectralon from Lanfei Optics ®The integrating sphere adopts a re optimized scintillation xenon lamp as the light source to provide good sample diffuse reflection illumination effect, thereby reducing the integration time,Can provide reliable and verifiable measurement results within 5 secondsThe new diode array spectrometer, combined with advanced fiber optics and optical performance, has been optimized at the system level to reduce stray light, improve wavelength stability, and enhance scintillation repeatability.

Easy to operate

You can generate a test report by clicking the button, which includes necessary information such as date, time, operator name, sample information, and test parameters. You can access this information on a personal computer and also print or output it in text format for further data analysis and processing.

*Easy to use application software

The UV-2000F software can use different measurement methods for UPF of textile samples, including AS/NZ 4399:19961, EN13758-1:2001, ATCC TM183-2000, GB/T18830, and user-defined methods. Compatible with Windows XP and Windows 7 operating systems, the software is simple and easy to use, and can achieve the acquisition, archiving, retrieval, and output of various types of textile data.

UV-2000FThe application software integrates on-site verification and re verification verification procedures to ensure the performance of the instrument. The calibration plate includes a wavelength calibration plate that can capture 6 spectral bands, and each UV transmittance analyzer includes a set of this standard.

Performance characteristics

●Stable measurement for rough structured samples

●Simple instrument validation program to ensure accurate and repetitive measurements

●One touch sample analysis design, 5Obtain analysis results within seconds

●You can use the system's built-in methods such as AS/NZ 4399:19961, EN 13758-1:2001 AATCC TM 183-2000, GB/T18830And the customer defined method automatically calculates the UPF value (UVB 280-315nm, UVA 315-400nm)

●Diffuse reflection SpectralonIntegral ball can provide better signal-to-noise ratio

●Convenient and compact size, saving laboratory space

meet the standard

GB/T18830、 AS/NZS 4399:1996、EN 13758-1:2002、AATCC TM 183-2000、 Japanese Fashion Association standards, etc.

Technical specifications

System properties and performance

Wavelength range: 250 to 450nm

Wavelength accuracy: ± 1nm

Broadband (FWHM):<4nm

Wavelength interval (data interval): 1nm

Optical Structure

Integral sphere material: Spectralon

Integral ball opening size:<5%

Sample exposure area: 0.79cm2

Light source: scintillation xenon lamp

UV dose without measurement cycle:<0.2J/cm2

Sample holder: manual platform

measurement range

Transmittance rate: 0-100%

Absorption value: 0-2.7AU

Scanning time:<5s

Computer interface: USB

Power supply requirements: 220-240V, 60/50Hz