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Thermo Fisher Electron Microscope
K-Alpha X-ray photoelectron spectroscopy system
NegotiableUpdate on 01/31
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Overview
The K-Alpha X-ray photoelectron spectrometer system features an efficient electron lens, hemispherical analyzer, and detector, allowing for rapid detection and data acquisition.
Product Details
K-Alpha X-ray photoelectron spectroscopy system
K-Alpha X-ray photoelectron spectroscopy systemX-ray photoelectron spectroscopy for high-performance surface analysis
The Thermo Scientific K-Alpha X-ray photoelectron spectroscopy (XPS) system has brought a new method for surface analysis. The K-Alpha XPS system focuses on providing high-quality results using simplified workflows, making XPS operations simple and intuitive without sacrificing performance or functionality. The K-Alpha XPS system is an integrated monochromatic small spot XPS system with deep analysis capability.
The more advanced performance, lower price, easier usability, and larger sample testing volume make the K-Alpha XPS system an ideal choice for multi-user environments. The K-Alpha XPS system enables researchers around the world to conduct surface analysis.
Characteristics of K-Alpha X-ray photoelectron spectrometer
High performance X-ray source
The K-Alpha X-ray photoelectron spectrometer is equipped with an X-ray monochromator that allows for selection in 5 µ m steps within the analysis area of 50 µ m to 400 µ m to seek the desired signal.
Sample View
Use the optical observation system of K-Alpha XPS system and XPS SnapMap to focus the sample, helping you quickly determine the analysis and testing area.
in-depth analysis
Use the EX06 ion source equipped with K-Alpha X-ray photoelectron spectrometer for deeper surface analysis. The performance and experimental reproducibility ensured by automatic source optimization and gas processing functions.
Optional Sample Stand
We offer a variety of special sample stages that are compatible with K-Alpha X-ray photoelectron spectroscopy for you to choose from, including those used for variable angle XPS, sample bias testing, or inert transfer of samples from glove boxes, and more.
Excellent electronic optical system
Efficient electronic lenses, hemispherical analyzers, and detectors enable K-Alpha X-ray photoelectron spectrometers to achieve detection and rapid data acquisition.
Insulation sample analysis
In the K-Alpha X-ray photoelectron spectrometer, the obtained dual beam electron source couples low-energy ion beams with low-energy electrons (less than 1 eV) to prevent sample charging during analysis, thereby eliminating the charge effect in most cases.
Digital control
The intuitive operation guided by Avantage data system makes the K-Alpha XPS system an ideal choice for multi-user, testing center, and XPS experts who focus on efficient operation and high testing volume.
Performance data of K-Alpha XPS system
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| vacuum system |
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