In situ battery charge imaging system

In situ electrochemical interference scattering imaging confocal Raman correlation system

High resolution, in-situ characterization, and special ion migration observation solutions

Interference scattering imaging is an imaging technique based on microscopic imaging technology, which has high resolution and high contrast. It uses laser wide field illumination to obtain the scattering signal of the sample on the laser, and then images the surface of the sample through interference. Due to the exceptional sensitivity of interference signals to changes in the refractive index of the sample surface, it is possible to image the subtle changes on the particle surface caused by electrochemical charge and discharge processes with high spatial resolution, and reflect the formation, transformation, and migration processes of ion compounds during charge and discharge with high contrast, and analyze their electrochemical mechanisms.

The system also combines confocal microscopy Raman imaging technology, which can achieve in-situ characterization of interferometric scattering imaging and confocal Raman spectroscopy at the same position of the sample, thus comprehensively characterizing the changes in material structure, composition, and other properties during charge and discharge processes, as well as the process of ion migration.

A special interferometric scattering imaging mode that reflects the formation, migration, and distribution of ionic compounds.

In situ interferometric scattering imaging and Raman spectroscopy/mapping results of the same region of the sample can be obtained.

• High spatial resolution (300nm 720nm wavelength).

Automated operations such as autofocus and data acquisition functions ensure the stability and usability of the optical path.

• Electrochemistry and battery materials

Micro nano materials such as two-dimensional materials