Hefei High and Low Temperature Impact Test Chamber

NegotiableUpdate on 12/27

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Nature of the Manufacturer: Producers

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Overview

The Hefei high and low temperature impact test chamber is used to test the degree to which material structures or composite materials can withstand continuous environments of instantaneous and extremely low temperatures, in order to test the chemical changes or physical damage caused by thermal expansion and contraction in a relatively short period of time.

Product Details

Hefei High and Low Temperature Impact Test ChamberUsed to test the degree to which material structures or composite materials can withstand continuous environments of high and low temperatures in an instant, in order to test the chemical changes or physical damage caused by thermal expansion and contraction in a shorter period of time. The high and low temperature impact test chamber is used in industries such as electronic and electrical components, automation parts, communication components, automotive parts, metals, chemical materials, plastics, as well as in the defense industry, aerospace, military industry, BGA, PCB substrates, electronic chip ICs, semiconductor ceramic magnets, and polymer materials to test the physical changes of their materials under repeated high and low temperature resistance, as well as the chemical changes or physical damage caused by thermal expansion and contraction of products. It can confirm the quality of products and is an ideal testing tool for everything from excellent ICs to heavy machinery components

Product Description of High and Low Temperature Impact Test Chamber:
1. Applied to adaptability testing of semiconductor devices, electronic products, and other equipment under conditions of rapid changes in ambient atmospheric temperature.
2. Vertical two box structure, automatic control of high and low temperature box circulation process, adjustable dwell and transition time, stainless steel inner tank, multi form recording, equipped with various safety protection measures and devices.
3. Meets MIL-STD-810D method 032, GB2423.22-89Na, GJB1505-86, etc.

Hefei High and Low Temperature Impact Test ChamberTechnical Specifications:

WenDegree impact testing machine			CTS01		CTS03	CTS05
Studio size (mm)			470× 470× 460		680× 680× 650	780× 780× 850
Basket size (mm)			350× 350× 300		580× 580× 500	680× 680× 700
Dimensions (mm)			2000× 1100× 1650		2350× 1360× 2000	2500× 1580× 2200
skill technique ginseng number	temperature range	high temperature	＋ 60℃～ 150℃
		low temperature	－ 70℃～－ 10℃
	Temperature preheating upper limit/pre cooling lower limit		＋ 180℃ /－ 75℃
	Temperature fluctuation/temperature deviation		± 0.5℃ /± 2℃
	Heating time/cooling time		45min（ 20～ 150℃） /45min（ 20～－ 55℃）
	Temperature recovery time		≤ 5 minutes
Carrying basket load-bearing capacity			10Kg	18Kg		25Kg
Temperature Controller			Imported programmable temperature controller
temperature sensor			Pt100 platinum resistor
refrigeration system	Refrigeration unit/method		Imported German valley wheel semi closed compressor unit/binary cascade compression refrigeration
	cooling method		Water cooling (cooling water pressure: 0.2-0.4MPa, water temperature: ≤ 30 ℃)
	condenser		plate heat exchanger
Heater, cooler			Nickel chromium alloy electric heater, finned cooler
circulating fan			axial flow fan
Pneumatic cylinder			Basket in high and low temperature chamber conversion driver
air compressor			Provide compressed air for driving the cylinder (optional)
Security protection measures			Overtemperature, overload, overvoltage, leakage, short circuit, power phase loss, phase error protection
material	Shell/inner wall/insulation material		Cold rolled steel plate electrostatic spraying/SUS304 stainless steel plate/rigid polyurethane foam or ultra-fine glass wool
Standard Configuration			Test hole, lighting lamp, observation window, insulated glass observation window with electroplated heating film
power supply			380V± 10％， 50Hz， 3P＋ N＋ G
Meet the test method			GB/T2423.22、 GJB150.5、 GJB360.7、 GJB367.2
Power (Kw)			10.0		15.0	20.0