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8th Floor, Building 14, Jinshan Zhiyuan Garden, No. 199, Lane 520, Tongning Road, Qianjiang Street, Jiangbei District, Ningbo
Ningbo Ruike Micro Intelligent Technology Co., Ltd
8th Floor, Building 14, Jinshan Zhiyuan Garden, No. 199, Lane 520, Tongning Road, Qianjiang Street, Jiangbei District, Ningbo
Measurement parameters: It can simultaneously detect key indicators such as resistivity, block resistance, and material thickness, meeting multi-dimensional detection needs.
Automated operation: Supports automatic positive/negative current output and voltage measurement, compatible with multiple testing modes such as single point, five point, and surface scan, and the number of testing points can be freely set.
Data processing: Professional V4.0 analysis software can achieve data collection, statistical analysis, unit conversion, generate 2D/3D scanning spectra and detailed test reports, and support data export and printing.
Flexible adaptation: The probe pressure can be adjusted within a range of 100-500g, and the stage supports 2-12 inch circular wafers and customized 153mm × 153mm square wafers, suitable for different specifications of samples.
Safety protection: equipped with limit range protection, pressure protection, emergency stop function, and abnormal alarm to ensure operational safety and equipment stability.




| Specification project | technical indicators |
|---|---|
| sheet resistance | 10^-5~2×10^5Ω/ □ (FT-3110A); 10^-6~2×10^5Ω/ □ (FT-3110B) |
| resistivity | 10^-5~2×10^5Ω-cm(FT-3110A); 10^-6~2×10^5Ω-cm(FT-3110B) |
| test current | 0.1μA-100mA(FT-3110A); 0.1μA-1A(FT-3110B) |
| resistance accuracy | ≤ 0.3% (standard resistance) |
| Single point repeatability | ≤0.5% |
| Power parameters | AC 220V ± 10%, 50Hz, power consumption < 600W |
Semiconductor materials: wafers, semiconductor substrates, selective emitter diffusion sheets, electroplated copper resistors, etc;
New materials: ferroelectric materials, nanomaterials, amorphous/microcrystalline silicon materials, etc;
Electronic components: solar cells LCD、OLED、 Touch screen, etc;
Research and Production: Material Analysis in University Laboratories and Research Institutes, Quality Testing in Electronic Manufacturing Industry.
Standard configuration: 1 host, 1 set of testing lines, 1 linear four probe probe, 1 set of gold-plated spring copper needle and 1 set of spring tungsten needle, 1 set of analysis software, and 1 measurement certificate;
Optional accessories: 2-12-inch wafer sample stage, customized probe specifications, computer+printer, 1-3 year extended warranty service.