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Room 707, Aiqian Building, 599 Lingling Road, Xuhui District, Shanghai, China
Product Categories
- Z-series stereomicroscope Leica Z6 APO
- F30 online film thickness tester
- F60 Fully Automatic Film Thickness Tester
- Diener NANO plasma cleaning machine
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- LF-2000 Integrated In Situ Nanomanipulation Machine
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- Passive isolation table GWA-TM
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- TS150 6-inch manual probe station
- 4200A-SCS parameter analyzer
- F40 Microscopic Film Thickness Measuring Instrument
- Zeta20 multi-mode 3D optical profilometer
Shanghai Nateng Instrument Co., Ltd
EM-AFM electron microscope in situ atomic force microscope
NegotiableUpdate on 01/24
- Model
- Nature of the Manufacturer
- Producers
- Product Category
- Place of Origin
Overview
EM-AFM electron microscope in situ atomic force microscope
Product Details
EM-AFM can be used inSEMSimultaneously providing atomic force microscopy imaging and nanomechanical measurement. It combines the advantages of these two technologies, can obtain high-resolution 3D images at high speed, and observe the interaction of nanoscale forces in real-time at the micro nano and sub nano scales, which is different from conventional methodsSEM/FIBCompatible and compatible withEDS, EBSD, WSDCompatible.
major function
EM-AFM can be used inSEMSimultaneously providing atomic force microscopy imaging and nanomechanical measurement. It combines the advantages of these two technologies and can perform morphology scanning3DImaging, nanoindentation/Nano tensile testing, etc.
lFEATURES
Simultaneously obtainingAFMandSEMimaging
Fully compatible with mainstream scanning electron microscopes
Simple sample replacement
Ultra high resolution morphology scanning
Measurement of Nanoforce by Nanoindentation Method
High operational stability, not affected bySEMElectron beam interference
Vacuum lock compatible
Technical capabilities
3、 Application
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