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Nanjing Nuojin Expressway Analytical Instrument Factory
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Nanjing Nuojin Expressway Analytical Instrument Factory

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    Building B4, Phase III, Science and Technology Innovation Center, No. 3 Gutan Avenue, Gaochun Economic Development Zone, Nanjing City, Jiangsu Province

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Dual system furnace front molten iron quality management instrument

NegotiableUpdate on 05/06
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Overview

NJ-TG3 TG4 dual system furnace front iron quality management instrument $r $n1, temperature transmitter: imported Omron temperature transmitter, minimum resolution 0.1 ℃ $r $n, accuracy level F.S #177; 0.01%$r$n2、 Motherboard: Military grade industrial motherboard $r $n3, Display: 17 inch LCD widescreen display: with touch function $r $n4, Command input: equipped with touch screen and industrial waterproof mouse two sets of operating systems $r $n5, Record output: USB portable storage $r $n6, Measurement time: 100 seconds

Product Details

NJ-TG4Pre furnace molten iron quality management instrument

NJ-TG3 Front Iron Quality Management Instrument


双系统炉前铁水质量管理仪

Note: Carbon silicon(C/Si detection system

双系统炉前铁水质量管理仪

Note: Carbon silicon manganese(C/Si/Mn)Detection system

1、 Main technical parameters:

Measurement Name measure Quantity range measure quantity essence degree

1 Temp 0 - 1370℃ F.S±0.01%

2、 CE% 2.20%-4.80% ±0.05%

3、 C% 2.00%-4.20% ±0.05%

4、 Si% 0.20%-4.50% ±0.10%

5、 Mn 0.10%-1.40% ±0.15

6The SG% 62%-95% ±10.0%

7The RM HTl00-HT350 minimum

2、 Instrument specifications

1. Temperature transmitter:ImportOmronTemperature Transmitter, minimum resolution0.1℃

accuracy classF.S±0.01%

2. Motherboard: Military grade industrial motherboard

3. Display: 17inchLCD widescreen displayEquipped with touch function

4. Command input:Equipped with two operating systems of touch screen and industrial waterproof mouse

5. Record output: USB portable storage

6. Power supply: AC 220V 50Hz

7. Measurement time: 100 seconds

8. Measurement result: automatically displayed

9. Detection system:Having two sets of detection systemsCarbon silicon (C/Si) detection system and carbon silicon manganese (C/Si/Mn) detection system, can be switched freely

3、 Software functions

1、 CE、C、SiTheMnContent measurement

1) Can measure the active CE, C, and Si content of 10 target materials and calculate the grade of molten iron (HT);

2) Active CE carbon equivalent measurement range: 2.20 4.80%;

3) Measurement range of active C content: 2.00 4.20 %;

4) Measurement range of active Si content: 0.204.50%;

5)Mn content measurement range: 0.10-1.40% (this content detection is a reference value)

6)ActivityCE、C%、Si%TheMn%The correction value can be in(-0.99+0.99) is set.

2. Iron liquid adjustment calculation

Based on the target composition range, iron liquid weight, carbonization yield, silicon yield, and measurement results, calculate the amount of carbonization agent, ferrosilicon, or scrap steel that hits the target composition.

3. Measurement of spheroidization rate

By measuring the eutectic degree and undercooling of molten iron, the activity can be improvedUnder the premise of sufficient Mg content, calculate the spheroidization rate of the spheroidized iron liquid.

4Management of Iron Liquid Composition

Set carbon equivalent, carbon content, and silicon content based on product gradeManganese contentThe composition range will be displayed in different colors by the instrument, with unqualified displayed in red and qualified displayed in green. Users can also modify the content range themselves.

5. Introduction to Active Ingredient Measurement Screen

1) Current date and time

2) Version number of this instrument

3) Maximum temperature (TM)

4) Initial crystallization temperature (TL)

5) Eutectic temperature (TE)

6) Carbon Equivalent (CE1)

7) Carbon content (C%)

8) Silicon content (Si%)

9)Manganese content(Mn%

10) Estimated Iron Liquid Grade and Range Chart (HT/FC)

11) Carbon Equivalent and Range Graph (CE2)

12) Carbon content and range graph (C%)

(13) Silicon content and range graph (Si%)

14) Thermal analysis temperature curve

15) Real time temperature (Celsius)

16) Current detection line information box

17) The target composition range of Si

18) Function Conversion Button

19) Target Material button

20) Weight setting button

21)Detection Settings button

22) "Data browsing" button

23End System button

6. Introduction to spheroidization rate measurement interface

1) Current date and time

2)Version number of this instrument

3) Maximum temperature (TM)

4) Initial crystallization temperature (TL)

5) Eutectic Low Point (TEl)

6) Re glow temperature (TEh)

7) Cooling rate and chart

8) Undercooling degree and chart

9) Re shining time and chart

10) Spheroidization rate and chart

11) Temperature curve

12) Real time temperature

13) Current detection line information

14) Function Conversion Button

15) Material selection button

16) Weight setting button (this interface is invalid)

17) Detection Settings button

18) Data browsing button

19) End System button