Dielectric temperature spectrum measurement system

DMA/DMS seriesDielectric temperature spectrum measurement systemAdopting an integrated design to directly measure key parameters of dielectric materials. The curves of dielectric constant, dielectric loss, impedance, and their changes with temperature, time, and frequency are obtained, along with phase θ, Cole Cole plot, admittance plot, and electromechanical coupling coefficient of piezoelectric materials (optional).

Measuring principle

The parallel plate capacitance method, also known as the three terminal method in ASTM D150 standard, works by inserting a material or liquid film between two electrodes to form a capacitor, and then measuring its capacitance to calculate the dielectric constant based on the measurement results. In actual testing equipment, two electrodes are equipped on a fixture that holds dielectric materials. Impedance measuring instruments measure the vector components of capacitance (C) and loss (D), and then calculate the dielectric constant and loss tangent using software programs.

Dielectric temperature spectrum measurement systemFeatures:

1. Measure the dielectric properties of dielectric materials

2. Measurement method: Parallel plate capacitance method

3. Built in commonly used key parameters, five step operation, easy measurement

4. High purity platinum electrode, resistant to high temperature and oxidation, with low contact resistance

5. Multiple measurement environments: inert, oxidizing, reducing, vacuum

6. Sample pressure test, with a maximum of 0.25N, to ensure that the measurement process does not damage the sample

7. Multiple fixtures to choose from, suitable for testing solid, liquid, powder, and film samples