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Room 707, Aiqian Building, 599 Lingling Road, Xuhui District, Shanghai, China
Product Categories
- Z-series stereomicroscope Leica Z6 APO
- F30 online film thickness tester
- F60 Fully Automatic Film Thickness Tester
- Diener NANO plasma cleaning machine
- Vista-IR High Resolution Nanoinfrared Imaging and Spectroscopy System
- LF-2000 Integrated In Situ Nanomanipulation Machine
- 6-inch nanoimprint machine NIL-150
- Passive isolation table GWA-TM
- High precision nano stretching system Nano UTM T150
- RSA5000 series spectrum analyzer
- TTR500 Series Vector Network Analyzer (VNA)
- MTA02 Micro Force Displacement Test Control System
- PA1000 power analyzer
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- TS200 8-inch manual probe station
- F3 Single Point Film Thickness Tester
- Candela CS920 Surface Defect Detector
- P170 fully automatic wafer probe profilometer/stair step meter
- NX Hivac High Vacuum Atomic Force Microscope
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- NX-HDM fully automatic defect detection atomic force microscope
- P17 automatic wafer probe profilometer/stair step meter
- NX Wafer Fully Automated Wafer Inspection Atomic Force Microscope
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- Nano observer electrical atomic force microscope
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- Multi functional maskless laser direct writing
- Optical surface defect analyzer
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- Explorer Electron Beam, Magnetron, Thermal Evaporation Thin Film Deposition
- DV-502 Thermal Evaporation Thin Film Deposition
- Desktop Pro Thin Film Deposition - Magnetron Sputtering
- BenchTop Turbo Thermal Evaporation and Sample Preparation
- Desk V Thin Film Deposition Solution
- Hyperspectral microscope
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- Wafer warpage stress measuring instrument
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- Semi automatic wafer bonding machine
- proximity aligner
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- Electron microscope sample cleaning machine
- CMP20 electrochemical mechanical polishing machine
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- VITA reactive ion etching machine (vertical chamber)
- COWIN High Throughput Integrated Plasma Reaction Ion Etching Cleaning System
- LAVIDA Paraxylene Coating Equipment
- Co series desktop plasma etching machine cleaning machine
- CLONE dual-mode plasma etching machine cleaning machine
- Liquid particle size analyzer
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- Laser sampling
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- ADR low-temperature constant temperature dry mK system
- Liquid Particle Sizer - LPC
- High temperature 3D printer
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- S100 type digital source table
- NX12 Biological Atomic Force Microscope
- Zeta-388 automatic multi-mode optical profilometer
- TS200-HP high-power probe station
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- MicroXAM800 White Light Interferometer
- TS300 12 inch manual probe station
- MDO34 oscilloscope
- In situ AFM in SEM
- Pulse laser deposition system (PLD)
- Active Vibration Isolation Platform AMT
- Duramin-100 hardness tester
- 3-inch nanoimprint machine NIL75
- In situ automatic nanomanipulation system
- In situ MEMS chips and synchrotron radiation holders
- In SEM HT high-temperature in-situ nanoindentation instrument
- Duramin-4 hardness tester
- High temperature in-situ nanoindentation instrument
- Active isolation table ARISTT
- Active isolation table ARISMD
- Passive vibration isolation SOTOT
- Passive isolation table GWA-M
- Passive isolation table GWA-TO
- Active isolation table PMT
- Diener Pico plasma cleaning machine
- Diener FEMTO plasma cleaning machine
- FT-NMT04 Nano Mechanical Performance Testing System
- ACCUTOM-10/-100 cutting equipment
- X1 series digital adjustable drying cabinet
- EZ series stereomicroscope
- DM 4500P semi-automatic intelligent digital polarizing microscope
- Leica M Series Stereoscopic Microscope LeicaM165FC/205FA
- S series stereomicroscope
- Leica M Series Stereoscopic Microscope LeicaM125/165C/205C/205A
- DM750P professional polarizing microscope
- EUV/X-ray reflector
- X-ray Fresnel zone plate (FZP)
- Grating template
- MPI Titan RF Accessories
- GGB microwave probe
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- Silicon nitride thin film window
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- GGB active high impedance needle tip
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- Hole shaped template
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- Duramin-40 hardness tester
- 4-inch nanoimprint machine NIL-100
- Leica room temperature ultra-thin slicer Leica EM UC7
- Film thickness measuring instrument
- BI-2500 desktop surface plasmon resonance analyzer
- Established Active Vibration Isolation Platform
- BI-4500 high-throughput fully automatic surface plasmon resonance analyzer
- TS150-HP high-power probe station
- Scanwave Scanning Microwave Near Field Impedance Microscope
- MVI scattering scanning near-field optical microscope
- TS150 6-inch manual probe station
- 4200A-SCS parameter analyzer
- F40 Microscopic Film Thickness Measuring Instrument
- Zeta20 multi-mode 3D optical profilometer
Shanghai Nateng Instrument Co., Ltd
BI-4500 high-throughput fully automatic surface plasmon resonance analyzer
NegotiableUpdate on 01/24
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Overview
BI-4500 high-throughput fully automatic surface plasmon resonance analyzer
Product Details
all-newBI-4500Surface plasmon resonance(SPR)The instrument has a multi-channel flow mode, which helps to deal with low fixed quantities and small molecular quantities(<100 Da)Accurate detection of analytes.BI-4500Equipped withBI-DirectFlowTM (BI- DC technology)Afterwards, precise injection and nearly zero diffusion mass transfer processes were combined for the study of rapid kinetics and effectively eliminated the interference of various surface phenomena. Users can flexibly choose from a variety of ingenious analysis modules to engage in fields such as life sciences and electronics3Chemical, gas-phase, or liquid-phase sensing research.
Channel surface plasmon resonance instrument
High sensitivity small molecule detection
5-channel high-throughput fully automated sampling
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