Atomic force microscope manufacturer

Atomic force microscope manufacturer

The laser detection head and sample scanning table are integrated into one, stable and reliable;
Precision laser and probe positioning device, easy and convenient to replace probes and adjust light spots;
◆ Single axis drive sample automatically approaches the probe vertically, accurately locates the scanning area, and makes the needle tip perpendicular to the sample during scanning;
Intelligent needle insertion method for motor controlled pressurized ceramic automatic detection, protecting probes and samples;
High precision and wide range piezoelectric ceramic scanner, which can be selected according to different precision and scanning range requirements;
10X apochromatic objective lens optical positioning, no need for focusing, real-time observation

Atomic force microscope manufacturerTechnical Specifications

Basic working modes: contact mode, tapping mode, F-Z force curve measurement, RMS-Z curve measurement
◆ Optional working modes: friction/lateral force, amplitude/phase, magnetic force, and electrostatic force
Sample size: Φ ≤ 90mm, H ≤ 20mm
Scanning range: 50um in XY direction, 5um in Z direction (optional 110um in XY direction, 10um in Z direction)
Scanning resolution: 0.2nm in XY direction, 0.05nm in Z direction
◆ Sample movement range: 0-20mm
Optical magnification of 10X, optical resolution of 1um (optional 20X, optical resolution of 0.8um)
Scanning rate 0.6Hz~4.34Hz, scanning angle 0~360 °
Scan control: XY uses 18 bit D/A, Z uses 16 bit D/A
Data sampling: 14 bit A/D, dual 16 bit A/D multi-channel synchronous sampling
Feedback method: DSP digital feedback
Feedback sampling rate: 64.0KHz
Communication interface: USB 2.0/3.0
Operating environment: Windows XP/7/8/10 operating system

Atomic force microscope manufacturerScope of application