Atomic Force Microscope Laser Raman Integrated Machine (FM Nanoview Ra AFM), with an integrated design of optical microscope, atomic force microscope, and Raman spectrometer, has powerful functions.
Product Features:
◆Integrated design of optical microscope, atomic force microscope and Raman spectrometer, with powerful functions
◆ Simultaneously equipped with optical microscope, atomic force microscope imaging function, and Raman spectroscopy analysis function, without affecting each other
◆ Simultaneously equipped with optical two-dimensional measurement and atomic force microscope three-dimensional measurement functions
The laser detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability
◆ Precise probe positioning device, laser spot alignment adjustment is very simple
◆ Single axis drive sample automatically approaches the probe vertically, making the needle tip scan perpendicular to the sample
Intelligent needle insertion method for motor controlled pressurized ceramic automatic detection, protecting probes and samples
◆ Ultra high magnification optical positioning system, achieving precise positioning of probe and sample scanning areas
◆ Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%
◆ Can supportMultiple wavelengths including 405nm, 532nm, 633nm, 785nm, 830nm, 1064nm, etc
Technical Specifications:
Atomic force microscope:
working mode |
contactpatternTap lightlypattern |
Optical eyepiece |
10X |
Optional mode |
friction/Lateral force, amplitude/Phasemagnetic force/electrostatic force |
Lighting method |
Kohler lighting system |
Force spectrum curve |
F-Z力CurveRMS-Zcurve |
Optical focus |
Coarse and micro manual focusing |
XYscanning range |
50×50um, optional20×20um,100×100um |
camera |
500megapixelCMOSsensor |
Zscanning range |
5um, optional2.5um,10um |
display screen |
10.1Inch flat panel display with image measurement function |
Scanning resolution |
horizontal0.2nmVertically0.05nm |
scan rate |
0.6Hz~30Hz |
sample size |
Φ≤68mm,H≤20mm |
Scanning angle |
0~360° |
Sample table itinerary |
25×25mm |
runtime environment |
Windows XP/7/8/10operating system |
Optical objective lens |
5X/10X/20X/50XFlat field apochromatic objective lens |
communication interface |
USB2.0/3.0 |
Raman:
Raman spectral range |
200-3600cm-1 |
resolution |
<15cm-1@25μm slit |
laser |
532 ± 1nm, linewidth ≤ 0.2nm(Optional lasers with different frequency bands) |
Laser power stability |
≤3% P-P(@2hrs) |
output power |
0-100mW adjustable |
Filter laser cut-off depth |
OD8 |
Operating Temperature |
0-40℃ |
Operating Humidity |
5-80% |
Laser lifespan |
5000hrs |