700 series semiconductor switch matrix host

Main Features

Compared to early 700 series hosts, the command to connection speed has significantly improved
708B host can control 1 8 × 12 matrix card
707B host can control up to 6 8 × 12 matrix cards
Compatible with popular plugin cards designed for 707A/708A hosts
Supports remote (via LXI, USB, and GPIB interfaces) and manual (via front panel) programming
Seamless integration with 4200-SCS through GPIB interface to achieve semiconductor I-V and C-V characteristic analysis
Store hundreds of switch configurations and channel modes in non-volatile memory for easy reuse
LXI interface supports remote programming and control
Embedded TSP ® The processor and TSP Link technology interface facilitate the source table of the 2600B series system ® SMU instruments integrated into high-speed, independent testers
14 digit digital I/O

Faster command to connection speed

The high-performance 707B and 708B semiconductor switch matrix hosts significantly shorten the time from command to connection, providing significantly faster test sequences and overall system throughput compared to earlier 707A and 708A hosts from Jishili.

7174A low current matrix cardThis 8 × 12 matrix card is designed specifically for semiconductor research, development, and production applications, meeting the demand for high-quality switching of I-V (current voltage) and C-V (capacitor voltage) signals.

Its low leakage and minimal dielectric absorption characteristics ensure that the measurement speed of key devices is much faster than early switching technologies. Low current performance makes it a source for 2635B and 2636B systems ® The ideal combination of SMU instruments can enhance the high-speed I-V signal source and measurement capability, and can be connected to the I-V and C-V measurement functions of the 4200-SCS parameter analyzer.

7072 Semiconductor Matrix CardThis 8 × 12 switch supports low level and high impedance measurements encountered in semiconductor parameter testing of wafers and devices.

It is equipped with two low current paths, with a maximum offset current of only 1 picoampere, suitable for sensitive sub picoampere level measurements; There are also two optimized paths that can be used to measure C-V (capacitance voltage) characteristics from DC to 1 megahertz. In addition, there are four high-quality signal paths with an offset current of less than 20 picoamps, which can be used for general signal switching up to 100 nanoamps or 200 volts.

7072-HV High Voltage Semiconductor Matrix CardSimilar to 7072, 7072-HV is designed to handle low-level, high-voltage, and high impedance signals.

It is equipped with two signal paths, capable of switching 1300 volts with an offset current of less than 1 picoampere, making it very suitable for switching high-voltage signals encountered in breakdown measurement or oxide integrity testing. Two of the pathways have been optimized and can be used for C-V (capacitance voltage) measurements from DC to 1 megahertz, or for switching low currents with a common ground. In addition, there are four high-quality signal paths with an offset current of less than 20 picoamps, which can achieve signal switching up to 200 volts.

Optimized for easy integration with systems based on the 2600B series

707B and 708B are ideal complementary products for systems that integrate 2600B series instruments, such as Jishili's ACS and S530 integrated testing systems. These hosts use the same TSP (Test Script Processor), Lua scripting language, and TSP Link interface as the 2600B series, and support ultra-low current switch matrix (7174A), which can complement the low current sensitivity of the 2636B. 707B/708B provides test system builders with a fast, scriptable switch matrix that seamlessly collaborates with all 2600B series models.