Bomi Technology showcases multiple image testing equipment at CIOE China Light Expo
At the CIOE exhibition, Bomi Technology showcased its accumulation in image quality testing in the field of camera technology and applications, showcasing products such as multispectral light boxes, endoscopic testing system BOMI-TSECIT, and standard QC light box BM03QC.
Time: September 10th to September 12th, 2025
Location: Shenzhen International Convention and Exhibition Center
Booth: 6E50, 6E51 (Smart Sensor Exhibition · Hall 6)
The 26th China International Optoelectronics Expo (CIOE 2025)
Enlitech attends the 26th China International Optoelectronics Expo (CIOE 2025)
Enlitech willSeptember 10-12, 2025Attend inShenzhen International Exhibition CenterOrganized byThe 26th China International Optoelectronics Expo (CIOE 2025).
As a globally renowned figureOptoelectronics and Semiconductor Industry Summit, CIOE brings together people from all over the worldOptoelectronic components, semiconductor devices, optical detection, intelligent sensing, and AIoT applicationsRelated experts and enterprises.
Enlitech showcases the latest intelligent sensing and semiconductor optical detection equipment
In CIOE 2025Intelligent Sensor Exhibition (Hall 6), Enlitech will showcase cutting-edge technologySemiconductor Optical Testing SolutionAssist researchers and engineers in accurately verifyingOptoelectronic sensors, SPAD, CMOS image sensorsThe effectiveness.
The key exhibits of this event include:
SPD2200: Commercial gradeSPAD Single Photon Avalanche Diode Efficiency Integrated Tester

APD-QE:Advanced Optical Sensor Quantum Efficiency Optical Instrument

SG-A:CMOS Image Sensor Tester

These devices can assist researchers and industrial engineers in breaking throughHigh speed chips, intelligent sensors, optoelectronic applicationsThe performance bottleneck.
Sincerely invite you to visit Enlitech booth 6E50 · 6E51
Enlitech will have a professional team providing on-site commentaryThe Application Value of Optical Testing and Intelligent SensingSincerely invite you to visitBooth 6E50, 6E51, communicate with usFuture Trends in Semiconductor Optical Testing!












