Zeiss X-ray Microscope Xradia 610& 620 Versa

The Carl Zeiss X-ray microscope Versa has become a "powerful helper" for researchers and scientists worldwide due to its excellent large working distance and high resolution (RaaD) characteristics. Maintaining high resolution even at relatively large working distances can help generate significant scientific insights and discoveries. With the rapid development of technology today, higher requirements have been placed on analytical instruments, and the Zeiss Xradia 600 Versa series is specifically designed to address this challenge.
Zeiss X-ray microscopes Xradia 610&620 Versa use improved light sources and optical technology
The two major challenges facing the field of X-ray computed tomography imaging are achieving high-resolution and high-throughput imaging of large-sized samples and large working distances. The two X-ray microscopes launched by Zeiss have solved these challenges with the following advantages: the system can provide a high-power X-ray source, significantly improving X-ray flux and accelerating tomography speed. The work efficiency has been doubled without affecting the spatial resolution. At the same time, the stability of X-ray light sources has been improved and their service life has been extended.
The main features of Zeiss X-ray microscopes Xradia 610&620 Versa include:
✔ The maximum spatial resolution is 500nm, and the maximum voxel size is 40nm
✔ Compared to the Zeiss Xradia 500Versa series, the work efficiency has doubled
✔ More user-friendly, including quick activation source
✔ Ability to observe submicron features of a wider range of sample types and sizes over a larger working distance
Higher resolution and throughput
Traditional tomography technology relies on a single geometric magnification, while the Zeiss X-ray microscope Xradia Versa will use optical and geometric two-stage magnification, while using a high-throughput X-ray source that can achieve faster sub micron resolution. High resolution imaging technology under large working distance (RaaD) can perform non-destructive high-resolution 3D imaging on larger and denser samples (including parts and equipment). In addition, the optional flat panel detector technology (FPX) can quickly perform macroscopic scanning on large volume samples (weighing up to 25 kg), providing positioning navigation for scanning the areas of interest inside the sample.
Realize new degrees of freedom
Utilizing industry-leading 3D X-ray imaging solutions to conduct cutting-edge scientific and industrial research: By maximizing absorption and phase contrast, we help you identify richer material information and features. Using diffraction contrast tomography (LabDCT) technology to reveal 3D crystal structure information. Advanced image acquisition technology can achieve high-precision scanning of large or irregularly shaped samples. Using machine learning algorithms to assist you in post-processing and segmentation of samples.
Excellent 4D/in-situ solutions
The Zeiss Xradia 600 Versa series is capable of dynamically characterizing the 3D non-destructive microstructure of materials in a controlled environment. Thanks to the Xradia Versa's ability to maintain high-resolution imaging at large working distances, samples can be placed in sample chambers or high-precision in-situ loading devices for high-resolution imaging. Versa can seamlessly integrate with other Zeiss microscopes to solve the challenges of multi-scale imaging.