ZEISS Sigma Field Emission Scanning Electron Microscope

ZEISS Sigma Field Emission Scanning Electron Microscope for High Quality Imaging and Analysis

Flexible detection and analysis performance with a 4-step workflow

Combine the analytical performance with field emission scanning technology and utilize mature Gemin electronic optical components. Multiple detectors to choose from: for imaging particles, surfaces, or nanostructures. Sigma's semi-automatic 4-step workflow saves a lot of time: setting up imaging and analysis steps to improve efficiency.

Sigma 300 offers high cost-effectiveness. Sigma 500 is equipped with backscattered geometric detectors, which can quickly and conveniently achieve basic analysis. Accurate and reproducible analysis results can be obtained for any sample at any time

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Flexible detector options for obtaining clear images

Using novel ETSE and Inlens detectors to obtain high-resolution surface morphology information under high vacuum,

Obtain clear images using VPSE or C2D detectors in variable pressure mode.

Generate high-resolution transmission images using aSTEM detectors.

Use HDBSD or YAG detector to analyze the components.

User friendly and easy to operate

SmartSEM Touch is an additional component of existing operating systems, designed for multi-user environments. It is a simple user interface that provides easy operation for both experienced expert users and novice users.

Based on the actual laboratory environment, the operation of SEM may be the specialized field of electron microscopy experts. However, non professional users (such as students, newly trained personnel, or quality engineers) also need to use SEM to obtain data, so there is also a need to use SEM. Sigma 300 and Sigma 300 VP take into account the needs of non professional users, and their user interface options can meet the operational needs of experienced microscope experts and novice microscope users.

Features:

ZEISS Sigma Field Emission Scanning Electron Microscope for Flexible Detection of Clear Imaging

Utilizing advanced detection techniques to tailor Siqma for your needs and characterize all samples

Utilize in lens dual detectors to obtain morphology and composition information.

By utilizing the new generation of secondary detectors, up to 50% of the signal images can be obtained. Utilizing Siama's innovative C2D and variable pressure detector in variable pressure mode, sharp images with up to 85% contrast can be obtained in low vacuum environments.