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Carl Zeiss (Shanghai) Management Co., Ltd
Zeiss Double Beam Electron Microscope Crossbeam 550 Samplefab
NegotiableUpdate on 01/19
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Overview
The Zeiss Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) specifically developed for TEM sample preparation in the semiconductor industry, provides excellent flexibility, automation capabilities, and user-friendly design to help make sample preparation in the semiconductor industry simpler and more efficient.
Product Details
Zeiss dual beam electron microscopeCrossbeam 550 Samplefab
[Product Introduction]
Zeiss dual beam electron microscopeCrossbeam 550 Samplefab，As a focused ion beam scanning electron microscope (FIB-SEM) developed specifically for TEM sample preparation in the semiconductor industry, it provides excellent flexibility, automation capabilities, and user-friendly design to help make sample preparation in the semiconductor industry simpler and more efficient.
[Product Features]
l Industry standard software interface
l Optimize configuration to enhance device and software stability
l fully automaticTEMSample preparation experience
l In situ（in-situ, lift-out）Compared to non in situ（ex-situ, pick-up）Flexible and available
l High quality automatic and manual sample preparation
[Application field]
Electronics and Semiconductor Industry, Failure Analysis andTEMSample preparation.
Use fully automatic non in situ mode separately（ex-situ, pick-up）In situ（in-situ, lift-out）Sample making TEMThin slice sample
Manual final thinning7nmProcess processor, flatTEMflake
useCrossbeaminsideSTEMDetector photography
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