ZEM18 desktop scanning electron microscope

NegotiableUpdate on 05/06

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

ZEM18 desktop scanning electron microscope from Zeyou Technology - superior to 6nm high-resolution desktop SEM. 90 second rapid vacuum extraction technology, supporting 200000 times magnification and BSE/SE dual-mode imaging. Seamless compatibility with in-situ accessories such as heating/cooling tables, widely used in fields such as new materials, new energy, biomedicine, semiconductors, etc. It is a cost-effective preferred desktop for universities, research institutions, and enterprises

Product Details

• Product Introduction

The ZEM series desktop scanning electron microscope launched by Zeyou Technology meets diverse application scenarios with its imaging technology and portability. This series of products, with its positioning and series layout in the domestic market, has achieved key performance indicators such as imaging clarity, ease of operation, and system integration that are in line with international standards.

The ZEM series, with its high integration and diverse configuration options, makes operation simple and intuitive, allowing even non professionals to quickly master it. The accompanying software supports the entire workflow, from sample preparation to parameter adjustment, to final imaging analysis, providing an integrated and efficient solution. The ZEM series has proven its analytical capabilities in multiple industries such as new materials, new energy, biomedicine, and semiconductors, helping researchers delve into the mysteries of the microscopic world. Due to its high cost-effectiveness, the ZEM series desktop scanning electron microscope has become the preferred equipment for many universities, research institutions, and enterprises.

• Product parameters

Key Metrics	ZEM18
Acceleration voltage	Maximum 18kV
resolution	Better than 6nm
magnification	200000
Filament type	Centered cartridge filament
Sample change time	1min30s
Vacuum mode	高真空 Low vacuum (1-60Pa) (optional)
Sample stage movement range	Two axis sample stage Three axis sample stage (optional)
navigation camera	optical navigation
detector	BSE，SE
expansion capability	EDS、 Deceleration sample stage, in-situ stage

• Product Features

▲ Fully functional: It has multiple functions to meet the needs of different users.

▲ Quick Vacuum Extraction: Vacuum extraction can be completed within 90 seconds, improving work efficiency.

▲ Smooth imaging: Fast imaging speed, no ghosting or dragging, clear display of sample details.

▲ Acceleration voltage: 3-18kV continuously adjustable, 1kV step, providing flexible voltage selection.

▲ Diverse signals: Three types of signal detectors, SE, BSE, and EDS, can be optionally equipped to achieve composition and morphology analysis.

▲ Rich Expansion: It has rich in-situ expansion functions and is compatible with self-developed in-situ electron microscope accessories, such as heating stage, TEC cold stage, etc.