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Guangzhou Lingtuo Instrument Technology Co., Ltd
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Guangzhou Lingtuo Instrument Technology Co., Ltd

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    Room 102-202, Building 2, Building 6, Tian'an Science and Technology Park Headquarters, No. 555 Panyu Avenue North, Guangzhou, China

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ZEM15C desktop scanning electron microscope

NegotiableUpdate on 05/06
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Overview

ZEM15C desktop scanning electron microscope from Zeyou Technology - superior to 10nm cost-effective teaching grade SEM. Adopting a pre aligned tungsten filament design, with 150000 times magnification and plug and play operation, stable imaging can be achieved without the need for a shock absorber. Specially designed for university laboratories and industrial quality inspection

Product Details

Product Introduction

The ZEM series desktop scanning electron microscope from Zeyou Technology integrates multiple independent innovative core technologies, combining excellent imaging quality and portability to meet a wide range of application needs. As a desktop scanning electron microscope, the ZEM series has reached the highest level in imaging resolution, ease of operation, system integration, and other indicators.

The ZEM series products have high integration, flexible configuration options, easy operation, simple learning, and can be quickly mastered by non professionals. The supporting software runs through the entire workflow, from sample import, parameter setting to imaging analysis, providing one-stop efficiency and convenience. At present, the ZEM series has demonstrated its analytical strength in many fields such as new materials, new energy, biomedicine, semiconductors, etc., helping researchers intuitively observe the mysteries of the micro nano world. Thanks to its excellent cost-effectiveness, the ZEM series desk scanners have become one of the preferred choices widely adopted by universities, research institutes, and enterprises.


• Product parameters

Key Metrics

ZEM15C

Acceleration voltage

Maximum 15kV

resolution

Better than 10nm

magnification

150000

Filament type

Centered cartridge filament

Sample change time

1min30s

Vacuum mode

高真空

Sample stage movement range

Two axis sample stage

navigation camera

optical navigation

detector

BSE,SE


• Product Features

▲ Plug and play: Users can quickly use it without the need for complex installation processes.

▲ Compact size: easy to place on a regular experimental table, saving space.

▲ High cost-effectiveness: Pre aligned tungsten filament design allows users to replace it themselves, reducing maintenance costs.

▲ Easy to operate: The fully Chinese interactive interface is concise and clear, and all operations can be completed through the mouse.

▲ Magnification factor: The maximum magnification can reach 150000 times, providing high-quality and clear images.

▲ Multi level shock absorption: No additional shock absorption platform is required, ensuring the stability of imaging.