ZEM Ultra Field Emission Desktop Scanning Electron Microscope

NegotiableUpdate on 05/06

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Zeyou Technology ZEM Ultra Field Emission Desktop Scanning Electron Microscope - superior to 2.5nm ultra-high resolution desktop SEM. Adopting Schottky electron gun and three-stage vacuum system, supporting 500000 times magnification and EDS/EBSD analysis. Suitable for the fields of nanomaterials, battery research and development, and semiconductor testing

Product Details

• Product Introduction:

The ZEM Ultra desktop scanning electron microscope adopts a Schottky field emission electron source and a three-stage independent vacuum design, with a resolution better than 2.5nm, which meets the characterization requirements of most sample microstructures. Standard configuration includes large beam current and large sample compartment, supporting in-situ functional sample stage and EDS/EBSD expansion.

• Product features:

▲Strong usability

▲Fully automatic operation

▲Schottky field emission electron gun

▲high stability

▲High-resolution observation

▲Enrich and expand

• Product parameters

Key Metrics	ZEM Ultra
resolution	≤2.5 nm
magnification	one million times
Image pixel size (default)	512 * 512 (video) 2048 * 2048 (photo)
Acceleration voltage	1-15kv continuously adjustable
Filament type	Field emission filament
Electric Sample Stand	XY two axis/XYZ three axis/XYT three axis/five axis
detector type	BSE、SE、EDS
deceleration mode	Optional (0-10kV sample stage voltage deceleration)
optical navigation	Optical navigation, in warehouse camera
Internal dimensions of sample compartment	176mm wide * 185mm long * 125mm high
Automatic function	Automatic brightness contrast, automatic focus, large image stitching
Expansion function of in-situ station	possess