Xradia 410 Versa X-ray microscope

Xradia 410 Versa X-ray microscopeIt fills the gap between high-performance X-ray microscopes and less powerful computed tomography (CT) systems. The Xradia 410 Versa provides non-destructive 3D imaging with industry-leading resolution, contrast, and in situ functionality, allowing you to conduct breakthrough research on a wide range of sample sizes. Enhance the imaging workflow with this powerful and cost-effective "flagship" solution, even in different laboratory environments
4D and in-situ capabilities for flexible sample sizes and types in the industry
The Xradia 410 Versa X-ray microscope provides cost-effective and flexible 3D imaging, allowing you to handle a variety of samples and research environments. Over time, non-destructive X-ray imaging can preserve and expand the range of use of your valuable samples. This instrument achieves a true spatial resolution of 0.9 μ m and a small achievable voxel size of 100 nm. Advanced absorption and phase contrast (suitable for soft or low-Z materials) provide you with more features to overcome the limitations of traditional computed tomography (industrial CT) methods.
The Xradia Versa solution extends scientific research beyond the limits of projection based micro and nano CT systems. Traditional tomography relies on single-stage magnification, while the Xradia 410 Versa adopts a two-stage process based on a synchrotron aperture optical system. It is easy to use and has flexible contrast. Remote Breakthrough Resolution (RaaD) enables you to maintain sub micron resolution of a wide range of sample sizes in native environments and various on-site drilling rigs. The non-destructive multi length scale function allows you to image the same sample at various magnifications, thereby characterizing the evolution of material microstructural properties between consecutive treatments (4D) or under simulated environmental conditions (in situ).
In addition, the Scout and Scan control system can achieve an efficient workflow environment through recipe based settings, making the Xradia 410 Versa easy to provide convenience for users with various levels of experience.
　　Xradia 410 Versa X-ray microscopeadvantage
The Xradia Versa architecture adopts two-stage amplification technology, allowing you to achieve resolution at a distance (RaaD). Like traditional micro CT, the sample image is enlarged through geometric magnification. In the second stage, the scintillator converts X-rays into visible light and then optically amplifies them. Reducing reliance on geometric magnification enables the Xradia Versa instrument to maintain sub micron resolution over larger working distances. This enables you to effectively study a wide range of sample sizes, including in situ chambers.
Non destructive 3D imaging to preserve and expand the use of valuable samples
High spatial resolution as low as<0.9 μ m, voxel size as low as 100 nm
Advanced comparative solutions for low-Z materials and soft tissues
Industry's 4D and in-situ capabilities, suitable for flexible sample sizes and types
Scout and Scan control system, with easy-to-use workflow settings, is an ideal choice for multi-user environments
Overloaded sample stage and extended source and detector stage travel
*Less need for sample preparation
Easy navigation through multiple zoom detection systems
Continuous operation through automatic multi-point tomography and repeated scanning