XRD/X-ray diffractometer/in-situ tensile ultra-high temperature hot stage XH1200

The in-situ device designed specifically for X-ray diffraction analyzers can accurately control the real-time response of materials under multi field coupling conditions such as temperature variation and mechanical loading, and can be accurately adapted to mainstream XRD equipment such as Bruker, Thermo Fisher, Rigaku, and Shimadzu.

Fruit Instrument XH1200:The temperature range is RT~1200 ° C, with a temperature stability of 0.1 ° C. It can achieve precise temperature control in multiple modes including fixed-point, slope, and program segments.

Sample stage reflection/transmission optional; Circular arc window design, diffraction angle 2 θ: ∠ 0 °～ ∠ 164 °, using Kapton film as the window;

Customizable bracket, compatible with various models of X-ray diffractometers, such as Rigaku, Bruker, Thermo Fisher, Shimadzu, Panaco, etc.

XRD hot and cold table XH1200Features:

• Temperature range: -190 ℃~600 ℃

• Temperature stability: ± 0.1 ℃

Diffraction angle 2 θ: ∠ 0 °～ ∠ 164 °

Window material: Kapton film

• Atmosphere chamber, upgradable vacuum

• Can replace the upper cover and be used as a regular hot and cold table

XRD hot and cold table XH1200parameter：