SEM scanning electron microscope in-situ stretching table SFH5000-1200

SEM in-situ stretching table SFH5000-1200By using an external vacuum flange for modification free integration, precise temperature control and mechanical loading of the sample are achieved, and the micro dynamic process of the sample is captured in real-time with high stability. It is fully compatible with mainstream SEM such as Zeiss, Hitachi, Thermo Fisher, and Guoyi Quantum.

The SEM in-situ stretching table serves as a functional accessory for scanning electron microscopy (SEM) (without the need to modify the mirror body), compatible with EBSD mode, and can be optionally equipped with a temperature control module (such as a 1200 ℃ ultra-high temperature module) to achieve synchronous research on material microstructure evolution and in-situ mechanical response.

↑ In situ stretching table achieves functionality

↑ Customizable various types of fixtures

SEM in-situ stretching table SFH5000-1200Features:

• Temperature range: RT~1200 ℃

• Temperature stability: ± 0.1 ℃

• Force range: 0~5000N

• Tensile accuracy: 0.1% F.S

• Displacement distance: 10mm

• Stretching speed: ≤ 2mm/min

• Support customization

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