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Shanghai Xianben Technology Co., Ltd

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    harisonw@leadingoptical.com

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    18621582553

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    Room 201, No. 1, Lane 88, Tarim Road, Jiading District, Shanghai

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UV spectrophotometer

NegotiableUpdate on 01/05
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Overview
The Shimadzu UV-3600plus UV spectrophotometer is a new supplementary model in the product list of UV-VIS-NIR spectrophotometers UV-3600Plus is an upgraded product of UV-3150/3101, mainly used for measuring liquid samples, while SolidSpec-3700/3700DUV is mainly designed for measuring solid samples
Product Details

Product Name:UV spectrophotometer


Product model: UV-3600Plus


Product Features:

1. High sensitivity -3 detectors

Three detectors are configured, one PMT detector for detecting ultraviolet and visible regions, and InGaAs and PbS detectors for detecting near-infrared regions. The InGaAs detector compensates for the low wavelength sensitivity of PMT and PbS conversion, ensuring high sensitivity measurement throughout the entire detection wavelength range. When detecting at a wavelength of 1500 nm, the noise level is less than 0.00003 Abs, reaching the world's lowest noise level.


2. High resolution - wide measurement range and low stray light

Adopting high-performance dual monochromators, achieving high resolution (resolution up to 0.1nm) and low stray light (stray light below 0.00005% at 340nm). The wavelength range for measurement is 185nm-3300nm, which can be measured in a wide range of ultraviolet, visible, and near-infrared. Can meet the measurement requirements of a wide range of fields.

3. Rich accessories for various applications.


Solid samples can be measured using a multifunctional sample chamber and integrating sphere accessory device, and high-precision basic reflection measurements can also be performed using the ASR series basic reflection measurement device that ensures measurement accuracy. In addition, electronic hot and cold constant temperature cell racks and ultra micro cell racks can be installed to adapt to a wide range of application measurements.

The UV-3600Plus demonstrates low noise in the NIR region using InGaAs detectors.