TrueDrop® Contact angle tester

TrueDrop ® The SL200L contact angle tester is a device designed specifically for analyzing the surface cleanliness and wettability of precision materials such as liquid crystals, wafers, semiconductors, silicon wafers, and photoresists. Based on the large mobile platform and modular design concept, this device supports automatic liquid inlet, dynamic contact angle, and interface tension testing, providing precise data support for industrial quality inspection and research and development.

TrueDrop ® Core technical advantages of SL200L contact angle tester

1. Design of a large mobile platform:

   • Suitable for measuring cleanliness and contact angle of large-sized samples such as PCB boards, iPad displays, and touch screens.

   • Support surface wettability evaluation of precision materials such as liquid crystals, wafers, and semiconductors.

2. High precision optical system:

   • Industrial grade contour lens: Clear imaging ensures precise recognition of droplet contours.

   • Quartz glass soft light source: uniform background illumination to enhance image contrast.

3. Intelligent Software System (CAST) ™ 3.0）：

   • Dynamic contact angle analysis: supports forward/backward angle, rolling angle, and time-dependent contact angle measurement.

   • Calculation of surface free energy: Analyze dispersion force, polarity force, hydrogen bonding force and other components to evaluate the surface properties of materials.

   • Liquid gas/liquid-liquid interfacial tension testing: Accurate measurement based on Pendant Drop method.

4. Automatic liquid inlet system:

   • High precision droplet control, suitable for micro sample testing, reducing reagent consumption.

Industry pain point solutions

• Surface cleanliness testing: Quickly evaluate the residual surface pollutants of materials such as liquid crystals, wafers, semiconductors, etc. through contact angle and interfacial tension testing.

• Wettability analysis of photoresist: Optimize coating uniformity and adhesion in photolithography process to improve manufacturing yield.

Application field

• LCD display: Evaluate screen surface cleanliness and coating wettability.

• Semiconductor Manufacturing: Surface Contamination Detection and Wettability Analysis of Wafers and Silicon Wafers.

• Research and development of photoresist: optimize the coating performance of photoresist and improve process stability.

• Touch screen quality inspection: evaluation of surface cleanliness and coating adhesion.

technical advantage

• High precision control: micrometer level positioning accuracy, reducing mechanical vibration interference.

• Modular design: supports functional expansion and adapts to diverse testing needs.

• User friendliness: The wizard style software interface combined with one click operation function reduces the threshold for use.

Service Support
Provide professional technical services and customized solutions to ensure efficient application of equipment in research and quality control.

Definition of contact angle

The angle formed when a small liquid droplet is dropped on a solid horizontal plane and the liquid phase is sandwiched between the gas-liquid interface and the solid-liquid interface at the solid liquid gas three-phase boundary point on the surface of the solid is called the contact angle.

Application Scope Table

Compliance with standard table

SL200L series contact angle measuring instrument/tester product features and advantages

Industry pain point solutions

1. Top view 3D contact angle function:

   • Used to evaluate the influence of surface structure and chemical diversity of high-precision materials such as liquid crystals, wafers, and semiconductors on wettability, solving the problem of traditional methods being unable to accurately analyze micro rough surfaces and complex chemical compositions.

2. Mechanical Platinum Plate Surface Tension Test:

   • By using high-precision mechanical platinum plate method to detect residual organic pollutants on the surface of silicon wafers and photoresists, the industry pain point of rapid screening of pollutants in the manufacturing process can be solved.

Core Technology and Configuration

1. High precision control system

• Cross linear guide rail technology:

  • Manual control accuracy of 0.01mm, software control accuracy of 0.5 μ m, ensuring stable measurement of precision samples such as wafers and semiconductors.

• 9-dimensional mechanical structure design:

  • 2XYZ+3 horizontal adjustment system, coordinating the operation of the sample stage, camera, and injection system, and adapting to large-sized display screens (such as iPad, touch screen) for testing.

• Upgrade the infusion pump system:

  • The droplet control accuracy reaches 0.02 μ L (expandable to nL level), meeting the requirements for micro coating testing of photoresist.

2. Specialized optical imaging system

• High depth industrial lens (0.35-4.5X magnification):

  • Clearly capture the microscopic droplet morphology on the surface of liquid crystals and silicon wafers, and support surface correction technology to analyze the contact angle between concave and convex surfaces.

• High speed camera system:

  • German original 87 frames per second camera (upgradable to 1000 frames per second), dynamically records the process of photoresist wetting.

• Adjustable LED cold light source:

  • Avoid droplet evaporation interference and ensure the stability of photosensitive materials (such as photoresist) testing.

3. Intelligent Analysis Software (CAST) ™ 2.0）

• Dynamic contact angle analysis:

  • Support measurement of forward/backward angle, rolling angle, and time-dependent contact angle, suitable for dynamic adsorption research of semiconductor surface pollutants.

• Surface free energy model:

  • 12 algorithms (such as Acid base method) are used to analyze dispersion force and polarity force, evaluate material surface cleanliness and coating compatibility.

• Liquid liquid interface tension test:

  • Based on the Young Laplace equation fitting, support the analysis of interface behavior between photoresist and developer.

4. Extended functionality and compatibility

• Modular sampling system:

  • Compatible with PTFE needle tubes and fine needle tubes, suitable for testing high viscosity photoresist and hydrophobic materials.

• Standardized video mode:

  • Support multi brand host upgrades, data can be exported in Excel/BMP format to meet the needs of scientific research papers and industrial reports.

• Anti static design:

  • Ionic wind technology eliminates static interference in wafer and semiconductor testing, improving measurement accuracy.

Application scenarios

• LCD display industry: screen surface cleanliness and coating wettability testing.

• Semiconductor manufacturing: wafer/silicon wafer contamination screening, photoresist coating uniformity evaluation.

• Touch screen quality inspection: analysis of surface adhesion and cleanliness.

• Photolithography R&D: Optimize formula wetting performance and improve process yield.

technical advantage

• Precise adaptation to high-precision materials: specially designed for the microelectronics industry to solve the pain points of complex surface structures and difficult detection of pollutants.

• Full process automation: One click completion of image capture, calculation, and data storage, reducing human error.

• Anti interference design: A multi-layer horizontal adjustment system combined with anti-static technology ensures testing stability in the environment.

Technical Specifications

The main differences between each model are marked with "*" below.

enclosure:

1. Temperature control device:

Including (1) sample temperature control and (2) testing liquid temperature control;

These are two temperature control systems that respectively control the temperature of liquid and solid samples. It can be purchased separately or simultaneously.

The temperature control method for solid samples can be selected from one of the following two temperature control methods:

(1) Thermostatic water bath control: 0-95 ℃, temperature error within 0.1 ℃;

(2) Semiconductor heating and cooling: 5-85 ℃, temperature error within 0.5 ℃;

(3) Special temperature heating system: temperature control requirements such as 200 ℃ and 400 ℃ can be confirmed with us.

It is recommended to use a constant temperature water bath for liquid temperature control.

2. High temperature contact angle test: achieve maximum contact angle tests of 1400, 1700, 1800, and 2000 degrees; Customized products require a deposit.

3. Vacuum environment device: to achieve contact angle testing under vacuum or different gas environments; Customized products require a deposit.

4. Sample slot: effectively control the shaking of the sample and the influence of temperature, light, etc; Customized products require a deposit.

5. High temperature interfacial tension test: The interfacial tension test between melted solid materials and air is conducted using hanging drop or stopping drop interfacial tension analysis techniques. Customized products require a deposit.

6. Full range of needle tubes and needles

Including: 25uL, 100uL, 500uL, 1000uL high-precision microinjectors, as well as PTFE needles, stainless steel needles (various diameters), plastic needles, bent needles, etc

7. High precision dual channel software controlled automatic injection pump

8. Special fixtures: used for clamping fibers, films, paper, etc

9. Quartz glass sample tank for bubble capture method

10. Oscillating Drop Test Module

(1) By using high-frequency oscillators and closed-loop oscillation control systems, the control accuracy is higher and the control method is more flexible. Oscillators with different oscillation frequencies and amplitudes can be selected according to customer needs.

(2) The injection needle tube can be selected from 0.5uL, 1uL, 5uL, 15uL, 100uL, 500uL, 1000uL, etc.

(3) Oscillatory waveforms include positive arc waves, residual arc waves, triangular waves, linear waves, sawtooth waves, etc., with frequencies within 2KHz that do not attenuate or distort.

Example of Test Results for CAST 2.0 Image Analysis System

1. Analysis of Forward and Backward Angle Real Image:

Figure 1 Analysis method: Curve ruler fitting method (circle fitting, spline fitting, generalized quadratic curve fitting, etc.).

It is recommended to purchase injection pumps or peristaltic pumps for testing the forward/backward angle. There are two ways to form the forward/backward angle: (1) increasing/decreasing the droplet volume to form the forward/backward angle; (2) The sample table tilts to form a forward and backward angle. As shown in the figure above

2. Real graph of irregular contact angle analysis:

The picture shows the actual effect of silicone gel, and the contact angle value is calculated using curve ruler fitting technology. The fitting factor is over 90%.

Figure 2 Analysis method: Spline curve fitting method or Young Laplace equation fitting method

Special statement:

1. The above image information and technical parameters are subject to changes due to design without further notice, and the latest confirmed product information shall prevail.

2. Our company reserves all rights.

3. Asha ®、 RealDrop ®、 TrueDrop ®、 MicroDrop ®、 WBA ®、 ADSA ® It is a registered trademark of Shanghai Solon.

CAST^®Asha^®、ADSA^®、TrueDrop^®、RealDrop^®、TheDrop^®、MicroDrop^®、LMCA^®、Shsolon^®Solon^®Register a trademark for Shanghai Solon.

The above trademark is used for goods or services related to contact angle measuring instruments, surface tension meters, and interfacial tension meters. Infringement will be prosecuted!