Thin film defect detector

Project Background
As the main form of packaging material, film has become a raw material for industrial products. In the production process of thin films, due to the influence of production technology and on-site environment, it is easy to cause defects such as black spots, crystal dots, scratches, holes, lines, wrinkles, mosquitoes, etc. on the surface of the film. These defects not only affect the appearance of the film product, but more importantly, reduce the performance of the film. How to timely detect defects on the surface of thin films during the production process, eliminate the root cause of production, and achieve control and improvement of the surface quality of thin films has always been the goal pursued by thin film enterprises.
Modern industrial production has increasingly high requirements for the quality of film surfaces. Traditional detection methods such as manual visual inspection are no longer able to meet the requirements of high-speed, high-resolution, and non-destructive testing in industrial production. Compared with traditional manual visual inspection, CCD based film surface defect detection systems are fast and reliable. The advantage of accuracy has been widely applied by many film companies.
working principle
During normal production on the production line, the high brightness LED linear spotlight cold light source is used to illuminate the surface of the production line using the principle of transmission (for opaque thin film products, the detection principle of reflection is used). The line array camera installed on the production line performs real-time synchronous scanning, and at the same time, the system performs defect segmentation processing on the thin film images captured by the camera through the SIMV image processing unit.

Due to the significant difference in grayscale between defective images and normal products, the system is able to detect defects and effectively determine and classify them.

Technical Introduction
The film surface detection system is mainly used to detect defects such as black spots, crystal points, scratches, holes, lines, wrinkles, mosquitoes, etc. that appear on the surface of the film during the production process. With the help of an imaging system composed of industrial CCD cameras and high brightness LED linear spotlight light sources, the film surface defect detection system can timely and accurately reflect specific information such as pictures, shapes, sizes, and positions of defects. While providing accurate data for quality control and product rating, it effectively saves production costs and improves product quality.

Common Defect Images