Thermo Fisher Nexsa X-ray photoelectron spectrometer

NegotiableUpdate on 01/09

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Overview

Thermo Scientific Nexsa The X-ray photoelectron spectroscopy (XPS) system provides fully automated, high-throughput multi technology analysis while maintaining research grade high-quality analytical testing results. By integrating multiple analysis technologies such as ISS, UPS, REELS, Raman, etc., users are able to conduct truly joint multi technology analysis, thereby unlocking potential for further progress in microelectronics, ultra-thin films, nanotechnology development, and many other applications.

Product Details

Thermo Fisher Nexsa X-ray photoelectron spectrometerDescription

Thermo Fisher Nexsa X-ray photoelectron spectrometerMaterial analysis and development

The Nexsa spectrometer has analytical flexibility and can maximize the discovery of material potential. While maintaining research level quality of results, flexibility is provided in the form of optional multi technology collaboration, thereby achieving true multi technology collaboration for analysis, detection, and high-throughput.

Standardized functionality drives powerful performance:

·Insulator analysis

·High performance XPS performance

·In depth analysis

·Multi technology collaboration

·Dual mode ion source expands the deep analysis function

·Tilt module for ARXPS measurement

·Avantage software for instrument control, data processing, and report production

·Small beam spot analysis

Optional upgrade: Multiple analysis techniques can be integrated into your detection analysis. Automatic operation

·ISS: Ion Scattering Spectroscopy, analyzing the elemental information of the surface 1-2 atomic layers of materials, and analyzing some isotopic abundance information through mass resolution.

·UPS: Ultraviolet photoelectron spectroscopy is used to analyze the valence band energy level structure information and surface work function information of metal/semiconductor materials

·Raman spectroscopy technology is used to provide fingerprint information at the molecular structure level

·REELS: Reflected electron energy loss spectrum can be used for detecting H element content, as well as material energy level structure and bandgap information

With the optical view of SnapMap, focus on sample features. Optical views can help you quickly locate areas of interest and generate focused XPS images to further set up your experiment.

1. X-ray irradiation of a small area on the sample.

2. Collect photoelectrons from this small area and collect them in the analyzer

3. As the sample stage moves, continuously collect elemental spectra

4. Monitor the position of the sample stage throughout the entire data collection process, and use the imaging of these positions to generate SnapMaps

Thermo Fisher Nexsa X-ray photoelectron spectrometerApplication Fields

·Battery

·Biopharmaceuticals

·Catalyst

·Ceramics

·Glass coating

·Graphene

·Metals and oxides

·Nanomaterials

·OLED

·Polymer

·Semiconductor

·Solar cells

·Thin film