Thermo Fisher FEI scanning electron microscope ion source spot quotation

16830Thermo Fisher FEI scanning electron microscope ion source spot quotation

Thermo FisherFEL accessories and consumables

16830 ion source

4035 273 12631 Pull out the pole

4035 273 6 7441aperture

4035 272 35991Inhibition pole

4035 272 35971 Pull out the pole

1058129 Pull out the pole

1301684 Suppressor Inhibition pole

1096659 Aperture aperture

1346158 PT

Thermo Scientific Scios 2 DualBeam is an ultra-high resolution analytical focused ion beam scanning electron microscope (FIB-SEM) system that provides excellent sample preparation and 3D characterization performance for various samples, including magnetic and non-conductive materials. The Scios 2 DualBeam improves throughput, accuracy, and usability through innovative feature design, making it an ideal solution for scientists and engineers to meet their advanced research and analysis needs in academic, government, and industrial research fields.

High quality sub surface and 3D Information

Subsurface or three-dimensional characterization is usually required to better understand the structure and properties of the sample.The Scios 2 DualBeam and optional Thermo Scientific Auto Slice&View 4 (AS&V4) software provide high-quality, fully automated multimodal 3D dataset acquisition, including backscattered electron (BSE) imaging for maximum material contrast, energy dispersive spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructure and crystallographic information. When combined with Thermo Scientific Avizo software, Scios 2 DualBeam can provide high-resolution, advanced 3D characterization and analysis at the nanoscaleThe workflow solution.

Provide complete sample information at ultra-high resolution

innovative The NICol electronic chromatography column provides the foundation for the system's high-resolution imaging and detection capabilities. It is suitable for various working conditions, whether operating in STEM mode at 30 keV (accessing structural information) or at lower energy (obtaining detailed surface information without charge), and can provide excellent nanoscale details. The Scios 2 DualBeam features an in tube Thermo Scientific Trinity detection system designed to simultaneously capture angle and energy selective secondary electron (SE) as well as BSE imaging data. Not only can it quickly access detailed nanoscale information from top to bottom, but it can also quickly access information on tilted samples or cross sections. The optional under lens detector and electron beam deceleration mode can quickly and conveniently collect all signals simultaneously, revealing the smallest features on the material surface or in cross sections. The NICol chromatographic column with fully automatic alignment function can obtain fast, accurate, and reproducible results.

Quickly and conveniently prepare high-quality products TEM sample

Scientists and engineers are constantly facing new challenges, requiring highly localized characterization of smaller features in increasingly complex samples.The innovation of Scios 2 DualBeam, combined with the optional, easy-to-use, and comprehensive Thermo Scientific AutoTEM 4 software and the application expertise of Thermo Fisher Scientific, enables customers to quickly and conveniently prepare custom high-resolution S/TEM samples for various materials. In order to obtain high-quality results, low-energy ions need to be used for final polishing to minimize damage to the sample surface. The Thermo Scientific Sidewinder HT Focused Ion Beam (FIB) tube not only has high-resolution imaging and milling capabilities under high voltage, but also has good low-voltage performance, which can create high-quality TEM thin films.

16830Thermo Fisher FEI scanning electron microscope ion source spot quotation

Main Features

Quick and convenient preparation

use Sidewinder HT ion column obtains high-quality, field specific TEM and atomic probe samples.

Ultra high resolution imaging

Used in a wide rangePerformance within a broad sample range (including magnetic and non-conductive materials)Thermo Scientific NICol electron chromatography column.

The most complete sample information

Obtain clear, accurate, and charge free contrast through various integrated chromatography column and lens detectors.

High quality, multi-mode subsurface and 3D Information

Use optional AS&V4 software achieves high-quality, multi-mode subsurface and 3D information by precisely targeting the region of interest.

Accurate sample navigation

Highly flexible The 110 mm stage and Thermo Scientific Nav Cam camera inside the chamber allow customization according to specific application requirements.

No artifact imaging and pattern formation

Having a dedicated mode, such as DCFI、 Drift suppression and Thermo Scientific SmartScan mode.

Optimize your solution

flexible DualBeam configuration, including an optional low vacuum mode with a maximum chamber pressure of 500 Pa, can meet specific application requirements.

Specifications