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Shengbin Instrument Technology (Shanghai) Co., Ltd
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Shengbin Instrument Technology (Shanghai) Co., Ltd

  • E-mail

    ch@shengbinyq.com

  • Phone

    15202161235

  • Address

    Room 203-205, No. 88 Huguang East Road, Minhang District, Shanghai

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Thermo Fisher FEI Scanning Electron Microscope Accessories Consumables Agent Pull Out Pole

NegotiableUpdate on 01/08
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Overview
4035 273 12631 Thermo Scientific Prisma E scanning electron microscope (SEM), a consumable agent for Thermo Fisher FEI scanning electron microscope accessories, combines a wide range of imaging and analysis modes with * automation functions, providing the most complete solution compared to similar instruments. For industrial research and development, quality control, and failure analysis applications, a scanning electron microscope with high-resolution imaging, wide sample compatibility, and a simple and easy-to-use user interface is needed. Prisma E is an ideal choice for such applications.
Product Details

Shengbin Instrument Technology (Shanghai) Co., Ltd. is a systematic supplier specializing in the analysis and testing industry. We have been committed to supplying accessories and consumables for imported instruments in the field of analysis and testing technology. Our main advantages include distribution and agency brands such as Thermo Fisher original accessories and consumables (such as ICP spectroscopy, ICP-MS mass spectrometry, AAS atomic absorption spectroscopy, GC-MS gas quality, LC-MS liquid quality, ARL direct reading spectroscopy ARL3460, ARL4460, ARLiSpark 8820/8860/8880), 9800/9900X fluorescence spectroscopy, isotope mass spectrometry, infrared spectroscopy and other instrument spare parts), PerkinElmer consumables, Agilent consumables, Waters consumables, etc. Waters consumables, DIONEX chromatography consumables, Shimadzu consumables, Metrohm, CEM consumables, etc.

4035 273 12631Thermo Fisher FEI Scanning Electron Microscope Accessories Consumables Agent Pull Out Pole

Thermo FisherFEL accessories and consumables

16830 ion source

4035 273 12631 Pull out the pole

4035 273 6 7441aperture

4035 272 35991Inhibition pole

4035 272 35971 Pull out the pole

1058129 Pull out the pole

1301684 Suppressor Inhibition pole

1096659 Aperture aperture

1346158 PT

Environmental scanning electron microscope

The Thermo Scientific Prisma E scanning electron microscope (SEM) combines a wide range of imaging and analysis modes with * automation capabilities, providing the most complete solution compared to similar instruments. For industrial research and development, quality control, and failure analysis applications, a scanning electron microscope with high-resolution imaging, wide sample compatibility, and a simple and easy-to-use user interface is needed. Prisma E is an ideal choice for such applications. Prisma E is another successful practice based on the previous generation Quanta SEM.

Comprehensive performance, powerful nearby scalability, and integrationThe most intuitive elemental analysis capability achieved by Thermo Scientific ChemiSEM technology enables Prisma E to achieve micro/sub micron level imaging and analysis in any industry or field.

4035 273 12631Thermo Fisher FEI Scanning Electron Microscope Accessories Consumables Agent Pull Out Pole

Main Features

Information on elements within reach

Through optional selection ChemiSEM technology and integrated energy dispersive X-ray spectroscopy (EDS) are used for real-time composition surface distribution to achieve intuitive elemental analysis. This always online analytical capability can greatly improve your work efficiency and obtain the most complete sample information.

Excellent image quality

Flexible vacuum mode and lens vacuum technology enablePrisma E can achieve excellent image quality under low voltage and low vacuum conditions. And in each operating mode, simultaneous imaging of secondary electrons (SE) and backscattered electrons (BSE) can be achieved.

Minimize sample preparation time to the greatest extent possible

Low vacuum and The ESEM function can perform charge free/dehydration free imaging and analysis on non-conductive and/or aqueous samples.

In situ study of materials in their natural state

by virtue of Prisma E's Environmental (ESEM) mode allows for direct imaging of samples in heated, deflated, or humid conditions.

Excellent analytical skills

The warehouse supports up to installationThree EDS detectors, two of which have a 180 ° symmetrical EDS interface and can be equipped with wavelength dispersive spectroscopy (WDS), coplanar EDS/EBSD, and can achieve high-quality charge free EDS and EBSD analysis in low vacuum mode.

easy to use

The operating software has a user guide and undo function, which can enable novice users to perform efficient operations and greatly reduce the workload of expert level users.



Specifications

parameter

·Resolution in high vacuum, low vacuum, and 3.0 nm at 30 kV in ESEM

·in 7.0 nm at 3 kV (BSED, sample stage deceleration)

Standard detector

·ETD、 Low vacuum SED (LVD), ESEM SED (GSED), infrared CCD

Optional detector

·Thermo Scientific Nav Cam+camera DBS、DBS-GAD、ESEM-GAD、STEM 3+、WetSTEM、RGB-CLD、EDS、EBSD、WDS、 Raman spectroscopy, EBIC, etc

ChemiSEM technology (optional)

·Can be based on energy dispersion Real time quantification of elemental surface distribution using X-ray spectroscopy (EDS). Includes point analysis, line scanning, surface distribution, and element quantification.

Sample table deceleration (optional)

·-4000 V to+50 V

Low vacuum mode

·Gundam 2,600 Pa (H2O) 或 4, 000 Pa (N2)

Sample stand

·5-axis motor center sample stage, with a tilt range of 110 x 110 mm and 2105 °. Maximum sample weight: Untilted position, 5 kg.

Standard sample holder

·Standard multiple samples SEM bracket can be installed separately

·On the stage, it can accommodate up to 18 standard sample holders (⌀ 12 mm),

·Install samples without tools

sample warehouse

·340 mm wide, with 12 interfaces, capable of accommodating up to three EDS detectors (two symmetrical at 180 °), and featuring EBSD interfaces that are coplanar with the coplanar EDS.

in situAccessories (optional)

·Software controlled -20 ° C to+60 ° C Peltier Cold Stage

·Software controlled 1000 ° C low vacuum/ESEM hot stage

·Software controlled 1100 ° C high vacuum hot stage

·Software controlled 1400 ° C low vacuum/ESEM hot stage

·Integrated gas injection system: used for electron beam induced deposition of the following materials, supporting up to2 types of gases (other accessories may limit the number of available gas injection systems (GIS)):

oplatinum

otungsten

ocarbon

·Nano robotic arm

·Liquid nitrogen refrigeration station

·electron probe/Multi probe station