Temperature semiconductor testing, gas sensitivity testing, atmospheric probe station

NegotiableUpdate on 01/17

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

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Overview

The ambient temperature semiconductor testing gas sensitivity testing atmospheric probe station is an important equipment used for testing the electrical performance of semiconductor devices. It usually consists of precision mechanical structures, high-performance probe needles, and electrical performance testing instruments. Probe stations can directly perform electrical performance testing on semiconductor chips, integrated circuits, and other microelectronic devices, providing valuable information for research and production. The probe station is mainly used in the CP testing stage after wafer processing and before packaging process, responsible for wafer transportation and positioning, ensuring more stable signals are transmitted from the wafer surface to precision instruments, and achieving more accurate data testing and measurement.

Product Details

Temperature semiconductor testing, gas sensitivity testing, atmospheric probe station

Temperature semiconductor testing, gas sensitivity testing, atmospheric probe stationTechnical parameters;

blockbox
material	powder-coated carbon steel
Box size	180mmX120mmX80mm
Box size	about2KG
Window size on the box body	Φ42mm
Sample stand
Sample table material	aluminum alloy (Scalable vacuum adsorption) (Scalable insulation with the earth)
Sample stage size	φ30mm
probe
Electrical signal connector	Wiring adapter BNCjoint BNCTriple coaxial connector SMAjoint Banana plug Choose one line length1.2rice
Electrical properties	insulation resistance ≥5000MΩ Dielectric withstand voltage ≤500V Current noise ≤10pA
Number of probes	4Probe (expandable)6Probe)
Probe material	Tungsten alloy probe (Other)Material options available）
Probe tip	50Mm or10Mm(Other specifications)optional）
Manual probe mobile platform
mode of movement	Fully manual needle pointing
XAxis movement stroke	15mm±7.5mm(Need to manually push the slide table)
XAxis control accuracy	≥500μm
RAxis movement stroke	120° ±60°(Need to manually rotate the probe rod)
RAxis control accuracy	≥500μm
ZAxis movement stroke	5mm
ZAxis control accuracy	≤50μm(Manual thread adjustment probe rod required)

At present, the company has developed and produced more than ten series and dozens of products, including experimental electric furnaces, CVD gas supply systems, plasma cleaning machines, small ion sputtering instruments, small evaporation instruments, quartz tubes, vacuum sealed semiconductors, etc. Mainly suitable for research institutions and industrial and mining enterprises to study the physical and chemical properties of new materials, new energy and other fields, widely sold in major universities and material research institutes.

The company has multi-level cooperative relationships with domestic universities and research institutes, and has established open laboratories. Professors, engineers, and PhDs in related fields participate in the research and development of the company's products. We adhere to the company's development philosophy, rely on rigorous technical research and development capabilities, scientific and reasonable production processes, and strive for excellence in manufacturing requirements, wholeheartedly do a good job in product quality and service work. Ketan Instrument always looks forward to cooperating with you with a sincere heart.