FT-351High temperature four probe resistivity testing system
1、 Overview:
The use of a four probe dual electric measurement method to test square resistance and resistivity system combined with a high-temperature test chamber to configure a dedicated high-temperature test probe fixture meets the measurement requirements of semiconductor materials for resistance value changes due to temperature changes. The measurement and control software can display the change curves of temperature and resistance, resistivity, and conductivity data, which is an important tool for inspecting and analyzing the quality of conductor materials and semiconductor materials.
2、 Applicable industries:
Widely used for: production enterprises, universities, and research departmentsConductive ceramicsMeasurement of resistivity of silicon and germanium single crystals (rods, chips), determination of block resistance of silicon epitaxial layers, diffusion layers, and ion implantation layers, and measurement of conductive glass（ITO）Block resistance, resistivity, and conductivity data of other conductive thin films.
3、 Function introduction: LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Adopting high precisionADChip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports;
This instrument adopts4.3Large LCD screen display, simultaneously displaying LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness
Conductivity, different testing fixtures can meet the testing requirements of different materials..
Testing fixtures can be selected according to product and testing project requirementsThe dual electric measurement digital four probe tester uses linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and references the United StatesA.S.T.M
Standard. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes.
4、 Technical parameter data-51. Block resistance range: 102～5×10
Ω/□-62. Range of resistivity: 106×10
cm3. Test current range:0.1μA，1μA，10μA，100µA，1mA，10mA，
100 mA4. Current accuracy:±0.1%
reading
5. Resistance accuracy: ≤ 0.3%
6. Display readings: LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity7. Testing method:
Dual electric measurement8. Working power supply:input:AC 220V±10% ,50Hz
power waste:<30W9. Uncertainty error of the whole machine
: 1200≤ 4% (standard sample result)10. Temperature:℃ adjustable; Temperature value: ≤11-3℃； Temperature control accuracy: ±
°9999C11. Heating rate:Free setting within minutes10,900commonlyIt can be upgraded within minutes
℃； Power:
3kw.12. Furnace material: Made of composite ceramic fiber material, it has the characteristics of vacuum forming and high temperature powder retention.13. Specialized testingPCA set of software,
USB
Communication interface, software interface synchronously displays, analyzes, saves, and prints data!14. Selection: Computer and PrinterThere are also the following related products:FT-351High temperature four probe resistivity testing system; FT-352High temperature resistivity testing system for conductor materials;
FT-353High temperature surface and volume resistivity testing system for insulation materials.
ROOKO/
