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Hangzhou Hanze Instrument Co., Ltd
Spike direct reading spectrometer
NegotiableUpdate on 05/06
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Overview
As an innovative arc/spark technology, SPECTRO has been dedicated to developing the world's emission spectrometers for over 40 years. Today, Spike Corporation introduced CMOS detector technology, changing the direction and future of arc/spark analysis technology. Among all similar analyzers, the analysis speed provided by SPECTRLAB S is beyond imagination, with element detection limits as low as, while it can also provide ultra long normal operation time and very forward-looking flexibility.
Product Details
The SPECTRLAB S has the world's new CMOS based detector recording system, which is highly suitable for metal analysis. From trace elements to multi matrix applications, it provides extremely fast, highly accurate, and exceptionally flexible technological choices.
The speed of sample analysis is an important symbol of the progressiveness of the instrument. SPECTROLAB S introduced the demand for speed in the metal analysis market. For example, when detecting low-alloy steel, it can provide highly accurate measurements in 20 seconds or less!
From the perspective of technical indicators and actual usage effects, SPECTRLAB S is currently a high-performance spectrometer suitable for metal smelters. ForMetal reprocessingManufacturers, automobiles, andaerospaceManufacturers, andFinished and semi-finished products、electronic products、semiconductorFor manufacturers, her proposed solution is equally outstanding.
The speed of sample analysis is an important symbol of the progressiveness of the instrument. SPECTROLAB S introduced the demand for speed in the metal analysis market. For example, when detecting low-alloy steel, it can provide highly accurate measurements in 20 seconds or less!
From the perspective of technical indicators and actual usage effects, SPECTRLAB S is currently a high-performance spectrometer suitable for metal smelters. ForMetal reprocessingManufacturers, automobiles, andaerospaceManufacturers, andFinished and semi-finished products、electronic products、semiconductorFor manufacturers, her proposed solution is equally outstanding.
Obtain high-precision results within 20 seconds (e.g. low-alloy steel)
Reduce the workload of regular maintenance (spark table cleaning) by 8 times
The average detection limit of elements in low-alloy steel has been improved by 2 times, and the average detection limit of elements in pure aluminum has been improved by 5 times
The footprint of the instrument has been reduced by 27%
Standardizing the entire system with a single standard sample can save 30 minutes of work time per day
