Scanning Electron Microscope SU3500

Scanning Electron Microscope SU3500

High quality tungsten filament scanning electron microscope provides even better image quality.

By enhancing the analysis capability and operability of scanning electron microscopy with high image quality, Hitachi's advanced technology is condensed. The SU3500 tungsten filament scanning electron microscope has a new electron optical system that achieves a "3 kV acceleration voltage 7 nm resolution", a "real-time stereoscopic observation function" that enables real-time stereoscopic imaging, and a "UVD ultra-high sensitivity variable pressure detector" with higher detection efficiency. It sets a new standard for observation and analysis.

*1: Choose by yourself

feature

1. When observing at low acceleration voltage, the resolution is higher, which can better observe the subtle shapes of the sample surface and effectively reduce sample damage

2. The newly designed electronic optical system and signal processing technology achieve high-speed scanning and low-noise observation

Compared to traditional scanning electron microscopes, the automatic function has been shortened by approximately 11 seconds

3. A "UVD (Ultra High Sensitivity Variable Pressure Detector)" that can observe the subtle shapes of the sample surface very well under low vacuum * 4

4. It has the "real-time stereoscopic observation function" that realizes real-time stereoscopic imaging * 4

*2: Compared to Hitachi SEM S-3400N

*3: Time may vary depending on the observation conditions

*4: Choose by yourself

Specifications: