Brooke Flat Insertion EDS - XFlash FlatQUAD, High Efficiency and Sensitivity for X-ray Detection

QUANTAX FlatQUAD is an EDS microanalysis system based on the revolutionary XFlash FlatQUAD detector. This uniquely designed annular four channel SDD detector is located between the scanning electron microscope pole shoe and the sample during operation, and can obtain a larger solid angle for EDS analysis. Combined with ESPRIT analysis software, the QUANTAX FlatQUAD system can provide optimal surface distribution effects for samples that are difficult to analyze with traditional oblique insertion spectra. In the probe assembly of the XFlash FlatQUAD detector, four independent silicon drift chips are arranged in a circular pattern around the central hole, through which the incident electron beam passes. The detector material is specially selected to avoid affecting the electron beam and ensure high-quality electron microscopy images. Using new detector technology,

The core of QUANTAX FlatQUAD system - XFlash FlatQUAD detector，

Based on a novel detector design concept, the detector is installed at the horizontal interface of the scanning electron microscope sample chamber, placing the detector between the electron microscope pole shoe and the sample. Traditional detectors, on the other hand, use the tilted interface of electron microscopes. The XFlash FlatQUAD detector is compatible with different types of scanning electron microscopes. The detector is equipped with special polymer windows of different thicknesses, which can absorb backscattered electrons at different acceleration voltages.

Solid angle optimized by scanning electron microscopy energy spectrum analysis:

The position and size of the XFlash FlatQUAD detector chip (4 × 15mm effective area) provide a larger solid angle for X-ray acquisition in scanning electron microscopy. Capable of obtaining solid angles greater than 1 second and detection angles of at least 60 degrees.

Balancing ultra-high counting rate and energy resolution

The ultra-high acquisition efficiency brings ultra-high counting rate, and each chip is equipped with independent signal processing channels. The input count rate (ICR) and output count rate (OCR) can reach up to 4000kcps and 1600 kcps, respectively. Brooke's professional SDD technology ensures that XFlash FlatQUAD achieves energy resolution of Mn-K α 126eV, C-K 51eV, and F-K60eV within a counting rate of 100kcps.

Principle:

XFlash FlatQUAD is a flat insertion detector placed between the scanning electron microscope pole shoe and the sample. Four silicon drift crystals are arranged in a circular pattern around the central hole, and the incident electron beam passes through the central hole. Suitable for different working distances and with excellent performance.