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E-mail
zyyq2008@163.com
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Phone
18912626031
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Address
Room 417, Building 3, Weiji Technology Park, No. 5 Tian'edang Road, Wuzhong District, Suzhou
Suzhou Meimei Electromechanical Co., Ltd
zyyq2008@163.com
18912626031
Room 417, Building 3, Weiji Technology Park, No. 5 Tian'edang Road, Wuzhong District, Suzhou
Sanfeng Projector Objective 172-297 Accessories
objective lens
378 series - ultra long working distance objective lens
·Near ultraviolet correction lens processed with M/BD Plan Apo (bright and dark field of view)
M/LCD Plan NUV SeriesThe series achieves high color reproducibility throughout the entire field of view
Column (Near UV Lens), MPlanUV Series (UV Lens)
The required uniformity of the image.And the G Plan Apo series (glass cover correction lens can be used in real
The following objectives support a wide wavelength range, including focusing through a single window in near ultraviolet, airborne, and high-temperature applications.
See and ultraviolet laser. Professional LCD laser objective: M/LCD · Using environmentally friendly glass (free of lead or arsenic) as the lens material for the Plan NIR (- HR) series (used for ultra long working distance laser products).
BF (Bright Field of View) is used for observation/measurementBD (bright/dark field of view) is used for observation/measurement
Used for near-infrared color correction (NIR series)Used for near ultraviolet color correction (NUV series)
Used for UV color correction (UV series)
Sanfeng Projector Objective 172-297 Accessories


feature
1. Assemble a large field of view image sensor (equivalent to Type 2) to ensure unchanged optical performance, with a field of view radius approximately three times that of the VMU series and a field of view area expanded by approximately seven times, making a significant contribution to improving detection efficiency.
2. In addition to the usual bright field observation, polarized observation with suitable visual inspection and scar inspection, dark field observation, polarization characteristics, and other observation objects can also be performed.
When arranging multiple high-density devices, a wide range of objects can be inspected at once.