-
E-mail
120832712@qq.com
-
Phone
18923898569
-
Address
Room 905, Building 2, New City Development Center, No. 126 Tianyuan Middle Road, Moling Street, Jiangning District, Nanjing City (Jiangning Development Zone)
Product Categories
Nanjing Xince Software Technology Co., Ltd
RF probe
NegotiableUpdate on 01/30
- Model
- Nature of the Manufacturer
- Producers
- Product Category
- Place of Origin
Overview
The design, debugging, and testing of modern RF integrated circuits is another complex task. In addition to RF input and output signals, the device also requires oscillation free bias and digital control signals (such as for changing the gain of amplifiers). All of these need to be transmitted to the integrated circuit through individually configured contact pads as small as possible for each product. Based on years of practical experience in RF detection technology and deep cultivation to meet domestic testing needs, we have developed N contact RF detection technology to quickly test your RF IC
Product Details
Advantages Description:
Our proprietary laser+waterjet cutting probe head technology
Excellent HFSS simulation technology
Excellent DC to 110 GHz coaxial parameter extraction technology
Industry leading measuring instruments+modeling team
Meet the working temperature range of -55 ℃ to+125 ℃
Can quickly deliver tilt probes of 50, 100, 150, 200, and 250 µ m
Can choose beryllium copper or nickel alloy materials (nickel alloy is recommended)
Having over 110000 aging experiments
Compatible with multiple calibration chips or using GCC calibration chips
GCP RF microwave probe:
|
Connector connector: 2.92mm female head Needle tip configuration: GSG Center distance of needle tip: 50~250um Needle tip width: 28um Sliding distance: ≤ 30um |
Schematic diagram of probe head
|
The jGCP40 product has multiple models and different center distances to choose from. For detailed selection, please contact us.
Our RF detection technology is used to characterize RF integrated circuits. The spacing ranges from 50 μ m to 250 μ m, which can meet your various testing needs. Use online design capture forms to select RF signal (S), logic (L), and power (P) channels based on your integrated circuit pad layout, and build your probe.
Note: The commercial probe tip RF calibration standard adopts a coplanar design, including different types of calibration components: open circuit, short circuit, load, and circuit. Therefore, various types of probe tip calibration can be performed
Similar Product Recommend
