PN junction physical characteristic experimental instrument

NegotiableUpdate on 02/12

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

This experimental equipment uses a micro current source to supply forward current to the PN junction, and obtains the forward voltage drop value at both ends of the PN junction by adjusting the current magnitude. At the same time, this device is equipped with a temperature control system for measuring the volt ampere characteristic curves of PN junctions under different temperature conditions. Through in-depth research on the relationship between PN junction voltage, current, and temperature, we can obtain important parameters such as Boltzmann constant k, sensitivity S, and bandgap width of silicon materials.

Product Details

1、 Experimental content

1. Measure the variation curve of the forward voltage of the PN junction with the forward current at room temperature and obtain the Boltzmann constant;

2. Measure the variation curve of PN junction forward voltage with forward current at different temperatures and obtain the Boltzmann constant;

3. Under constant forward current conditions, measure the temperature dependent curve of the forward voltage drop of the PN junction and calculate the sensitivity of the junction voltage to temperature variation.

4. Calculate the bandgap width of semiconductor (silicon) materials at 0K.

2、 Instrument features

1. Use digital encoders for precise adjustment to ensure stability.

2. Easily switch the measurement range through buttons, with convenient operation and accurate readings.

3. Adopt P1D temperature control to achieve fast and stable temperature regulation.

3、 Specification parameters

1. Constant current source: Current output range: 10nA-10mA; Resolution of 1nA; 3-digit digital display;

2. Voltage meter: Range: 0-2.000V; 3 and a half digit digital display