Oxford Instruments Cypher ES Polymer Edition Atomic Force Microscope

NegotiableUpdate on 07/11

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Nature of the Manufacturer: Producers

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Overview

Jingtong Microscope Quotation Website Friendly Reminder: As this product has undergone multiple functional upgrades and updates, we cannot guarantee that the images and various parameters provided by Oxford Instruments CypherES Polymer Edition Atomic Force Microscope are the latest. We suggest that you click here to contact our online engineer for service, and we also welcome your phone consultation:! In the field of polymer research and development, CypherES has unparalleled performance and a wide range of applications

Product Details

Jingtong Microscope Quotation Website Friendly Reminder:

Due to multiple functional upgrades and updates of the product, we cannot guarantee that the images and parameters provided by Oxford Instruments Cypher ES Polymer Edition Atomic Force Microscope are the latest. We recommend that you click here to contact our online engineer for service, and we also welcome your phone consultation:!

In the field of polymer research and development, Cypher ES has unparalleled performance and a wide range of applications. One of our most popular configurations is now on the market, Cypher ES Polymer Edition now enjoys discounted prices and fast delivery.

Cypher ES polymer version includes:

Cypher ES Environmental Control Atomic Force Microscope

Compared to other ordinary atomic force microscopes, it usually has higher resolution

-Quick scan, obtaining results in just a few seconds

BlueDrive Thermal Incentive

-Simplify the operation of all lightly tapping imaging modes

-Make the imaging process more stable, even if there are temperature changes

-Make the nanomechanical imaging mode more quantitative

High temperature sample heater

-The sample can be heated to 250 ° C under controlled gas environment

-Easy to operate, no need for additional controllers, wires or pipelines

Fast force scanning imaging

-Capture high-speed force curve for storing modulus mapping

-Capture all curves, including deviations and Z-sensors

-Supports numerous indentation models, including Hertz, DMT, Sneddon, and JKR

Amplitude modulation frequency modulation viscoelastic mapping mode

-The fastest nanomechanical mapping mode (>20 Hz line scan rate)

-Quantitative measurement of storage modulus and loss tangent angle

-Large operating modulus range (~50 kPa -300 GPa)

Contact resonance viscoelastic imaging mode

-Quantitative measurement of storage modulus and loss tangent angle

-Suitable for high modulus materials (1 GPa -300 GPa)

Get Started Automatic Imaging Optimization

-Automatically optimize imaging parameters before scanning begins

-The first scanning line can obtain excellent data without damaging the sample or probe