Oxford Instruments Cypher ES Environmental Control Atomic Force Microscope

Cypher ES Environmental Control Atomic Force Microscope

Cypher with a complete set of environmental control functions

The Oxford Instruments Atomic Force Microscope Cypher ES is based on the excellent performance of Cypher S and has added a complete set of environmental control functions. Although the features of high resolution, speed, and stability are similar, Cypher ES can make operation very simple, whether in gas or liquid environments, temperatures ranging from 0-250 ° C, or some of the most stimulating chemical environments. Cypher ES can meet the most stringent testing requirements and is the ultimate AFM.

Environmental control makes operation easier

• Has the same outstanding performance as Cypher S
• Gas and liquid injection achieved through sealed units
• The sample temperature can be controlled between 0-250 ° C
• Highly compatible with irritating chemicals
• Expert scientists and engineers provide quick and detailed assistance

Cypher ES includes working modes

• contact mode
• DART ™ Pulse Frequency Modulation
• High order harmonic imaging mode (Dual AC) ™）
• Dual frequency resonant tracking piezoelectric mode (DART)
• Electrostatic force microscopy (EFM) technology
• Liquid imaging
• Force Curve Mode
• Force Mapping Mode (Force Curve Array Mode)
• Force modulation mode
• FM mode
• Kelvin Probe Force Microscopy (KPFM)
• Lateral Force Mode (LFM)
• Loss tangent mode
• Improved Frequency Modulation Mode (MFM)
• MicroAngelo ™ (Nanolithography/Nanomanipulation)
• Phase imaging mode
• Piezoelectric Response Force Microscopy Mode (PFM)
• Spectral switch PFM
• Tap mode (AC mode)
• Tap mode (AC mode) paired with Q controller
• Vector PFM

Cypher ES includes a laser module

MultiLux ™ Laser Modules

Cypher offers four Laser Modules, one of which is included with initial system purchase. It is possible to add any of the following additional laser modules to enhance the capabilities of the Cypher:

• Standard Laser Module:RF-modulated laser diode light source module with nominal 10 µm x 30 µm focused spot size. Recommended for all AC-mode imaging. (Model LD-STD)
• Small Spot Laser Module:RF-modulated laser diode light source module with nominal 3 µm x 9 µ m focused spot size. Recommended for all AC-mode imaging with small cantilevers. (Model LD-SS)
• Standard SLD Module:Superluminescent Diode (SLD) light source with nominal 10 µm x 30 µ m focused spot size. Recommended for all contact mode and force measurements. (Model SLD-STD)
• Small Spot SLD Module:SLD light source with nominal 3 µm x 9 µ m focused spot size. Recommended for contact mode and force measurements using small cantilevers. (Model SLD-SS)