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Suzhou Fusimaxing Technology Co., Ltd
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Suzhou Fusimaxing Technology Co., Ltd

  • E-mail

    sunny.yang@fusstech3d.com

  • Phone

    15111861765,18616347366

  • Address

    Room 1213, Zhongxin Ecological Building, No. 2 Keying Road, Industrial Park, Suzhou City, Jiangsu Province

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Optical profiler

NegotiableUpdate on 02/08
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Overview
The new 3D optical profilometer S neox integrates confocal, interferometric, and multifocal overlay technologies, with no moving parts inside the measuring head. The fully automatic optical profilometer S neox can measure different materials, structures, surface roughness, and waviness, covering almost all types of surface morphologies. Its versatility can meet a wide range of morphology measurement applications. The core of Sensofar is the integration of three measurement methods, combined with the SensoSCAN software system, providing users with an incredible intuitive operating experience.
Product Details

feature

Amazing measurement speed

By adopting new intelligent algorithms and innovative cameras, astonishing measurement speeds have been achieved. Data collection speed reaches180 fps。 The standard measurement collection speed is 5 times faster than before. S Neox has become the fastest surface measurement system in the market.

easy to use

Sensofar is committed to providing customers with the most incredible experiences. With the birth of the fifth generation S neox system, our goal is to make it easy to use, intuitive, and faster. Even beginners can operate measurements with just one click. Modular design software enables the system to adapt to diverse user needs.

Flexible and diverse functions

Quality Management

Rich automation modules facilitate quality control. From operator access control, measurement program storage, compatibility to barcodes/QR readers, as well as custom plugins in our dedicated SensoPRO software, can automatically generate analysis reports. Our optimization solution can work in a QC environment, with flexibility and easy-to-use interface, programmable and working 24 hours a day.

R&D

The three in one method of Ssnsofar only requires one click, and the system can switch to the scanning mode suitable for the current measurement task. Three measurement techniques are configured in the S neox sensor head: confocal, interferometric, and Ai multifocal overlay, all of which contribute significantly to the system's multifunctionality and effectively reduce noise in data acquisition. S Neox is the ideal choice for all laboratory environments and has a wide range of applications.

Four in one technology

1)Confocal mode

Confocal technology can be used to measure the morphology of various sample surfacesIt has a higher lateral resolution than optical microscopes and can reach0.10um. It can be used to measure critical dimensions. When using a lens with a magnification of 150 times and a numerical aperture of 0.95, the confocal measurement slope reaches 70 ° on smooth surfaces (86 ° on rough surfaces).

Confocal algorithm guaranteeZ-axis measurement repeatability in the nanometer range.

2)phase difference/White light interference mode

Phase difference interferometry is a sub nanometer level precision technique used to measure the height morphology of smooth surfaces. Its advantage is that any magnification factor can ensure sub nanometer level longitudinal resolution. useA 2.5-fold lens can achieve ultra-high vertical resolution and large field of view measurement.

White light interferometry is a technique for measuring various surface height morphologies with nanometer level measurement accuracy. Its advantage lies in the ability to ensure nanoscale longitudinal resolution at any magnification.

3)Multi focal plane superposition mode

Multi focal plane overlay technology is used to measure very rough surface morphology. Based on our rich experience in the fusion application of confocal and interferometric techniques, we have specially designed this function to meet the needs of low magnification confocal measurement. The biggest highlight of this technology is its speed(mm/s)、 Large scanning range and high support slope (up to 86 °). This feature is particularly useful for measuring workpieces and molds.

4)film

Thin film measurement technology can quickly, accurately, and non destructively measure the thickness of optical transparent layers without the need for sample preparation. The system obtains the reflection spectrum of the sample within the visible light range and compares it with the simulated spectrum calculated by the software to accurately find the matching thickness. It can be measured in less than a secondTransparent film ranging from 50nm to 1.5 μ m. The measurement spot depends on the magnification of the objective lens, ranging from 0.5 μ m to 40 μ m.

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The advantages of LED light source

useLED as a lighting source has more advantages than using laserFirstLED light sources can avoid the speckle phenomenon of laser light sources. Secondly, the lifespan of LED light sources is about 50000 hours (approximately 25 times that of lasers). The most important thing is that multiple LEDs means that suitable wavelengths can be selected for measurement according to the needs of the sample.Selection:630nm red light, 530nm green light, 460nm blue light, 575nm white light.

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Traceable and precise measurements

eachSNEOX is all about achieving precise and traceable measurements. Our equipment is calibrated using traceable standard blocks that comply with Part 700 and Part 600 standards in ISO25178. All indicators, including height and horizontal accuracy, flatness deviation, system resolution, etc., are obtained by measuring such standard blocks. We insist that all measuring equipment follow this standard.

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SneoxBefore leaving the factory, calibrated and traceable standard blocks are used and confirmed to meet the standards before leaving the factory. simultaneouslySENSOFAR will attach a detection report on measurement accuracy and repeatability with the device.

high resolution

The vertical resolution is limited by instrument noise, which is fixed for interferometric measurements, but confocal measurements rely on numerical aperture.Sensofar's proprietary algorithm provides nanoscale system noise for measurement technology with better lateral resolution of optical instruments. The morphology shown is a sub nanometer (0.3nm) atomic layerfromProvided by PTB.

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DIC observation

Differential interferenceDIC is used to emphasize very small height features that have no contrast in normal observation. By using Nomarski prisms, interference images were generated, solving the problem of sub nanometer level structures that are not visible in bright field or confocal images.

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design

Diverse configuration options-Platform size (from 4 inches to 12 inches)

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Oversized bracket

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software-Guided system

SensoSCAN software drives the system through a clear, intuitive, and user-friendly interface. Users will be guided to browse the 3D environment for a good user experience.

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Automation program module

The automatic measurement module makes it easier for customers to implement custom programming and achieve quality management and testing goals. Manually setting measurement point coordinates or importing coordinate files, setting measurement programs for each coordinate or batch, setting automatic image recognition alignment points, and finally defining tolerance ranges and report output formats completes all programming work.

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Multi point programming measurement

SNEOX has designed a completely new programming approach. By automatically identifying the same structure or product type, the program will replicate the measurement points and program at the same location. This will greatly improve programming efficiency and save personnel programming time.

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Automatic recognition of alignment points

By automatically recognizing the alignment points through images and performing position correction, fully automated measurement without human intervention has been achieved. Transforming the desktop computer that used to perform manual sampling into a semi-automatic testing device that can automatically measure and provide reports after manually placing the samples. The function of automatic alignment point recognition is also an offline sampling equipment moving towards industryAbility of 4.0.

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Extended measurement module-up to500Mpx

The extended measurement module of SensoSCAN allows users to easily define measurement layouts on surfaces through overview images. The measurement area can be automatically cropped into the desired rectangular, circular, or ring-shaped area. Suitable for large-area measurements up to 500 million pixels. Provide multiple scanning strategies, such as automatic focusing or focus tracking for each field of view, to minimize the vertical scanning range.

SensoVIEW's powerful analysis software

3D and 2D interactive views offer multiple scaling, display, and rendering options. Provide a toolkit suitable for preliminary inspection and analysis of 3D or 2D measurements. Measure critical dimensions, angles, distances, diameters, and highlight features using new annotation tools.

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Easy to use, concise yet powerful, designed specifically for you

The Sensofar system is equipped with a dynamic software that provides a complete set of user-friendly tools for displaying and analyzing measurement values. Users will receive training and guidance, familiarize themselves with the 3D environment, and obtaingoodUser experience: With just one click, operators can be called, design style eye-catching icons, easier to understand features, synchronized 3D, 2D, and sectional views are just some of the main features of SensoVIEW software.

1) Choose your own view: 3D and 2D interactive views offer multiple scaling, display, and rendering options.

2) Process your data: process data information or generate a complete set of operators for candidate layers.

3) Interacting with analysis tools: Various analysis tools required for preliminary examination and analysis of 3D or 2D measurement values.

4) Your analysis application: Create an analysis template to analyze a series of measurement results using the same preset process.

5) Get your results: Get customizable reports or export 3D measurement data in multiple formats.

ISO Parameters - Intelligent Calculation Tool for Key Parameters

The SensoVIEW analysis software provides a specific step-by-step guide to obtain surface texture parameters for roughness parameters according to ISO 21920 and 25178, and surface texture parameters for flatness parameters according to ISO 12781. This is a method that meets the ISO standards for roughness and waviness, simplifying the analysis process.

ISO 21920 Calculation

It is based onISO 21920 automatically filters out the main waveform and obtains roughness (Rx) and waviness (Wx) parameters. The calculation of parameters includes a set of predefined operators, filters (F-operator, S-filter, and L-filter), and other settings.

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ISO 25178 Calculation

Specially designed for those who are not familiar with itThe user design of ISO filters can now extract this information by simply selecting the surface type to be analyzed. This operator filters surfaces according to the ISO25178 standard and obtains surface texture parameters.

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ISO 1278 Calculation

SensoVIEW can easily extract four flatness parameters based on ISO 12781: Peak Valley Ratio (FLTt), Peak Reference Ratio (FLTp), Reference Valley Ratio (FLPv), and Root Mean Square (FLTq).

ISO standard - Surface texture characterization

ISO 25178: Geometric Product Specification (GPS) - Surface Texture: The surface layer standard is an international standard collected and organized by the International Organization for Standardization for the analysis of 3D surface texture. This is an international standard involving 3D surface texture specifications and measurements, particularly defining 3D surface texture parameters and related specification operators.

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according to ISO 25178 Calculation of Surface Parameters:

Height parameter(Height value in the Z-axis direction
Spatial parameters (spatial periodicity of data)
Mixed parameters: (spatial shape of data)
Functional parameters (parameters calculated from material ratio curve, surface morphology, valley floor and slope surface)
Functional volume parameters (calculate volume based on material ratio curve)

measurement shows-Sharp visualization of morphology

The image control options have been constantly evolving to better meet the needs of all sample types and customersMultiple image processing settings are included in each rendering visualization option, along with zoom options for easier adjustment.

Automatically managed rendering views

Five intelligent visualization modes (incorrect color, stacking, stacking) &Wrong color, correct color or directional brightness) always available

Choose freely on the home screen.

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Automatic flow setting

Users can freely control different parameters, such as zoom rangeZ-axis, stacking, color, and shadow settings.

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Waveform Tool

For displaying images andThere are several waveform options available for 3D measurement values: horizontal, vertical, circular, top/bottom

Free or average waveform. Various key dimension tools can be used to analyze waveform data.

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result-Customizable reports

Due to the ability to choose from different report templates, users can configure each section to meet their requirements as much as possible. A flexible way to obtain a clear and structurally sound report for each measurement, which can display collected information in addition to other content3D data, 2D contours, and all ISO parameters.

1) Create your own header and footer

2) Set the content to what you need

3) Choose a style to display your results

4) Excel&PDF formats, can be edited freely

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Can export in multiple formats 3D image

There are several options available for managing output files. inWhen saving measurements in SensoVIEW analysis software, the original data is always retained. Surface measurement data can be exported in *. dat, *. stl, *. pcl, and *. x3p formats.

Exportable results with statistical calculations

After applying the template, users can export statistical information that includes all key dimensions and is classified by size type or numberExcel file.

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SensoPRO Rapid Quality Control

Implementing rapid quality control on the production line has never been so simple. thanks toSensoPRO, The production line operator only needs to load the sample and follow the guided instructions to operate. The plugin based data analysis algorithm provides a high degree of flexibility. The new module can be easily customized to meet the needs of other industries.

market-Tailored solutions for each application

For customers who cannot find the features they need in our other available packages, our development team can provide customized solutions. We rely on the professional knowledge of engineers to seek solutions that are suitable for the required applications.

consumer electronics

The consumer electronics market includes semiconductors and printed circuit boards(PCB) and display industries, etc. Given its speed and automation capabilities, SensoPRO has become a true money saving tool in many application areas.

medical equipment

The medical market has extremely strict quality control and quality assurance standards.Sensofar's 3DOptical profilerIt can provide fast, non-destructive, and accurate control over the manufacturing process, as well as quality control over surface textures.

workwear

The design and manufacturing of cutting tools directly affect the production quality of the end-user industry.SensoPRO is very fast in analyzing dimensional measurements of thread root, tooth surface, and tooth crest, or calculating the cutting edge radius of blades and other cutting tools.

automation-working principle

this setThe 64 bit data analysis solution provides an environment for QA engineers and technicians to quickly and easily analyze production parameters. SensoPRO can be linked to the acquisition software (SensoSCAN), so that the measured data can be automatically transmitted to SensoPRO for analysis. Once configured, you can collect and analyze measurement data with just one click.

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performance-Management tools for QC managers

Optical profilerThe transformative innovation has greatly improved its usability, simplifying the task of creating parameter record documents and setting tolerances when comparing two sets of data to determine which are key parameters controlling the production line. Specially designed for non professional users who require traceable production control.

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performance-Extremely fast

Due to the ability to utilize multiple kernels, a large number of operations can be performed simultaneously, thereby improving the overall performance of the system. Easily handle larger files and/Or larger datasets.

performance-Command line available

This tool enablesThe batch analysis work of SensoPRO can run independently, achieving centralized analysis while using the Sensofar system for batch collection. By combining this solution with the SensoSCAN SDK, we can perform measurements and analysis simultaneously (on a separate computer), accelerating the QC process. The command line is a convenient way to call SensoPRO analysis software from other software.

result-Parameter statistical analysis module

Once the analysis is completed, the results and standard deviation of each parameter are displayed on the table. If any tolerances are applied, they will be highlighted in the summary section.

Advanced analysis software

SensoMAP is a powerful analysis and reporting tool developed based on Digital Surf's Mountains technology. The SensoMAP software has been modularized to meet customer needs. SensoMAP offers two levels (Standard and Advanced) and multiple modules (2D, 3D, or 4D modules, Advanced Contour, Particle and Particle, Statistics, and Splicing).

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easy to use-Extremely powerful report creation function

Specially designed for various research and industrial applications,SensoMAP software is a surface imaging, analysis, and measurement solution that can be integrated into Sensofar 3D optical profilometers. including:

1)imaging-Visualize surface data using cutting-edge imaging techniques and intelligent filters.

2)Measurement Science-Conduct analysis and research according to the latest standards and methods.

3)Report creation-Create detailed and accurate multi page surface analysis reports in a smart desktop publishing environment, with powerful automation capabilities to accelerate the analysis process.


Optional Husks

module

standard

Superior level

4D series

Advanced contour

Advanced profile

Advanced morphology

car

co-location

contour

Fourier and Wavelet

Lead analysis (distortion)

Particle analysis

Scale sensitive analysis

Shell Expansion

Shell topographic map

Modules included- Optional modules


Specifications

Equipment size(Mm/inch)

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Base and column

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controller


technology

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light source

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Objective lens performance-Mingchang

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Objective lens performance-interfere

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confocal/Ai multifocal superposition

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1.Maximum field of view system3/2 "camera and optical 0.5X

2.The pixel size of the surface.

3.L&S: Lines and Space, Blue Light Wavelength.

4.Calculate the system noise value based on the difference obtained from comparing two consecutive calibration lenses perpendicular to the optical axis.

5.On a smooth surface, at most71ºUp to on the scattering surface86º。

XY axis performance

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Z-axis performance

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System Configuration

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Computers and operating systems

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