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5th Floor, Building C7, Chuangyan Intelligent Manufacturing, Lane 456, Dieqiao Road, Pudong New Area, Shanghai
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Shanghai Boxun Instrument Technology Co., Ltd
Mini Pro Microscopic Spectroscopy System
NegotiableUpdate on 02/11
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Overview
Mini Pro is a compact, low-cost microscopic spectroscopy system designed specifically for researchers who require high spatial resolution spectral information. The $r $n microspectral system adopts a modular design, allowing researchers to quickly switch wavelength ranges and experimental configurations. Changing wavelength components is easy to operate and can be completed within five minutes. In addition to photoluminescence (PL) analysis, the system can also collect and analyze micro Raman spectroscopy, micro reflectance spectroscopy, and micro photocurrent.
Product Details
Øworking principle
1. The laser is focused on the surface of the sample, and the spectrometer collects the emission spectrum of the sample.
2. The sample has been X. Y-axis scanning to obtain the photoluminescence spectrum of each coordinate point; Z-axis adjustment of objective lens to maintain sample focus.
3. After collecting millions of spectra, analysis software extracts peak energy and intensity to generate high-resolution and high contrast physical images.
ØCore function coverage
The microspectral system adopts a modular design, allowing researchers to quickly switch wavelength ranges and experimental configurations. Changing wavelength components is easy to operate and can be completed within five minutes
In addition to photoluminescence (PL) analysis, the system can also collect and analyze micro Raman spectroscopy, micro reflectance spectroscopy, and visible photocurrent.
Core strengths
ØModular design and multifunctional integration
modular design |
Multi-functional integration |
Mini Pro Microscopic Spectroscopy SystemBy adopting a universal optical design and modular design, researchers can quickly switch wavelength ranges and experimental configurations by replacing wavelength component modules. |
Microscopic photoluminescence（PL analysis |
Microscopic Raman spectroscopy（Raman spectroscopic analysis | |
Microscopic photocurrent analysis | |
X. Y-axis and Z-axis scanning | |
Electroluminescence analysis | |
TRPL fluorescence lifetime analysis | |
Low temperature measurement analysis |
Øautofocus
autofocus |
key parameters |
Self developed technology, adapted to rough samples/Tilted/curved surface, laser spot always focused |
Wide spectrum: 200-1700 nm |
Spatial resolution: sub micron level (0.35 μ m) | |
Spectral collection volume: millions of records | |
Built in protective cover to isolate temperature difference/dust/ambient light interference |
Software: Fast Peak Fitting |
Cost: Economical and practical, supports customization |
Technical Specifications
category |
specific parameters |
excitation wavelength |
266–980 nm |
Sample XY scanning table |
Travel range: 5mm or 10mm Repetition accuracy: 20nm |
Objective Z-scanning table |
Travel range: 400 μ m Repetition accuracy: 5nm |
|
Collection Time (When the integration time is 10ms) |
100μm×100μm, 0.5μm 步长： 6min 5mm×5mm，50μm 步长： 2min 5mm × 5mm, 5 μ m Step size: 3h |
Sample observation |
LED、 Monochrome camera |
power supply |
120V、60Hz |
data interface |
USB 3.0 |
Dimensions & Weight |
43cm×38cm×58cm，14Kg |
|Software Analysis System
GPU analysis acceleration |
Using GPU accelerated peak fitting technology, |
It can complete millions of spectral fitting operations within one hour, | |
Support fitting multiple feature peaks, | |
Users can choose to use standard functions or custom functions. | |
Data analysis function |
Quickly extract the peak energy and intensity of each spectrum， |
Generate high-resolution, high contrast physical images, | |
|
Visual display of characteristic peak parameters in pseudo color images (such as energy unit eV) |
Typical Applications and Research Cases
ØGreen light-emitting diode (LED) defect recognition
The following picture shows a green light-emitting diode The photoluminescence (PL) spectrum of the green LED displays the intensity and peak energy of the emission peak at the defect site.
The experiment was conducted by measuring a transparent, hemispherical bump formed by covering an LED chip with epoxy resin.
Ø Composition and phase distribution of semiconductor alloys
Peak analysis can be used to analyze the physical properties of materials, such as chemical composition.
The following figure shows the spatial distribution of zinc (Zn) content in cadmium zinc telluride (CdZnTe).
ØLow temperature photoluminescence measurement
The low-temperature measurement component includes a Dewar flask, vacuum pump, temperature controller, etc. - data can be collected immediately upon opening the box.
ØIntegrated implementation of photoluminescence and Raman measurement
Peak Raman spectroscopy analysis was conducted on ultraviolet coloration and regions, and it was found thatSilicon carbon hydrogen（Pollutants with Si CH bond structure.
From“Photoluminescence and Raman mapping of β- Ga2O3,” AIP Advances (2021)”
The photoluminescence (PL) spectrum reveals gallium oxide (Ga)₂O₃）The distribution of defects in materials.
From“Localized UV emitters on the surface of Ga2O3,” Scientific Reports (2020)
(a) For the Raman spectrum of TiO2, regions of rutile, rutile, and amorphous phase are marked in the figure.
(b) Raman spectra for the selected region.From “Localized phase transition of TiO2 thin films induced by sub-bandgap laser irradiation,” J. Vac. Sci. Tech. A (2021).
Wavelength component module
Near IR | |
laser |
975 nm laser, 30-100 mW |
spectrometer |
NIRQuest+, 900-1700 nm |
Near IR,Raman | |
laser |
785 nm laser, 250 mW |
spectrometer |
QE Pro, 100-2800 cm-1 |
Red | |
laser |
635 nm laser, 1-2 mW |
spectrometer |
Maya Pro，635-1060nm |
Green | |
laser |
532 nm laser, 4-5 mW |
spectrometer |
Maya Pro，532-960nm |
Green,Raman | |
laser |
532 nm laser, 30-140 mW |
spectrometer |
QE Pro, 90-4000 cm-1 |
Violet | |
laser |
405 nm laser, 1-2 mW |
spectrometer |
Maya Pro，405-840nm |
Near UV | |
laser |
349 nm laser, 0-20 mW |
spectrometer |
Maya Pro，349-780nm |
Deep UV | |
laser |
266 nm laser, 5 mW |
spectrometer |
Maya Pro，266-700 nm |
Ready to use module, easy to install and debug, supports customized components
|System selection
ØStandard Microscope System
uCore positioning: Basic entry-level configuration
uMain features: No spectrometer included
uApplicable scenarios: Basic microscopic observation requirements
ØMini Pro Microscope Microspectral System
uCore positioning: Main research models
uMain features: Integrated spectral analysis function, supportingPL、 RamanMultiple measurement modes such as photocurrent
uApplicable scenario: Comprehensive material spectral analysis research
ØPremium Microscope Wafer Level Microspectral System
uCore positioning: Professional configuration
uMain features: Optimized for wafer level samples, with a larger scanning range
