Leco glow spectroscopy

Leco glow spectroscopyBy combining a glow discharge ion source and a dual focus high-resolution mass analyzer, almost all elements including C, N, and O in solid samples can be qualitatively and quantitatively analyzed. It is a direct and rapid method for analyzing the content of impurities in high-purity samples and the elemental composition of coating materialsTools.

Leco glow spectroscopyDefine new standards for direct analysis of advanced high-purity materials in solids. By minimizing calibration and sample preparation operations, the sample processing capacity can be increased and ultra-low detection limits can be achieved, making GD-MS suitable for bulk metal analysis and deep analysis applications.
Ceramics and several other non-conductive powders are analyzed using the secondary electrode method to provide the same level of sensitivity and data quality. This makes GD-MS a reliable standard method for trace metal analysis.
Almost all elements present in solid samples can be routinely detected and quantified: many elements have concentrations below parts per billion (ppb) levels.
µ s pulsed high flow rate glow discharge cell
High sensitivity ion source using pulse discharge mode
Widely adjustable sputtering rate suitable for fast overall analysis and advanced deep analysis applications
Analysis of alumina powder using secondary electrodes
Dual focus mass spectrometer
High ion transport rate and low background enable signal-to-noise ratio to reach sub ppb detection limits
High quality resolution can provide the highest level of selectivity and accuracy: it is a prerequisite for the analysis results of *
Twelve order of magnitude automatic detection system
Determination of matrix and trace elements in a single analysis, with a fully automated detector covering a dynamic linear range of 12 orders of magnitude
Direct quantitative determination of matrix element IBR (ion beam ratio)
Efficient and easy-to-use software package
All parameters are controlled by a computer
Fully automatic tuning, analysis, and data evaluation
Automatic LIMS connectivity
Remote control and diagnosis
Windows 7
The sample turnover time is usually less than 10 minutes
Capable of determining matrix elements to ultra trace elements in a single analysis
Deep analysis covers layer thicknesses ranging from hundreds of micrometers to one nanometer
Small matrix effect for easy direct quantification