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Laser diffraction particle size analyzer

NegotiableUpdate on 01/01
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Overview
The Beckman Coulter next-generation LS 13 320 XR laser diffraction particle size analyzer takes laser diffraction particle size analysis to a higher level. Upgraded PIDS technology and optimized 132 detectors ensure higher instrument resolution, more accurate results, and better reproducibility. Not only can you measure particles with a wider range of particle sizes, but you can also detect extremely subtle differences between particle sizes faster.
Product Details

Beckman Coulter's new generation LS 13 320 XR takes laser diffraction particle size analysis to a higher level, with upgraded PIDS technology (No. 4953978; 5104221) and optimized 132 detectors, ensuring higher instrument resolution, more accurate results, and better reproducibility. Not only can you measure particles with a wider range of particle sizes, but you can also detect extremely subtle differences between particle sizes faster. PIDS technology truly achieves 10nm particle size measurement; New dry and wet injection modules, "plug and play", meet different analysis requirements, flexible and convenient; The intuitive software and touch screen design greatly simplify the operation of the instrument, requiring only a few clicks to obtain the desired data. LS 13 320 XR will bring you a new measurement experience!
Laser diffraction particle size analyzerMain Features
• Superior to ISO 13 320 technical standard
Compliant with FDA's 21 CFR Part 11 standards
More detectors are available, up to 132 independent physical position detectors, corresponding to up to 136 real data channels, which can clearly distinguish the differences in scattered light intensity spectra between different granularity levels, ensuring no missing information and fast and accurate real granularity measurement.
The designed "X" - shaped logarithmic detector array can accurately record scattered light intensity signals, regardless of single or multiple peaks, and accurately analyze particle size distribution.
Fully automatic calculation and analysis function, multi peak automatic detection, no need to guess peak shape in advance, no need to select analysis model, providing objective reports.
The upgraded PIDS technology provides innovative high-resolution nanoparticle analysis capabilities, truly achieving 10nm lower limit peak measurement.
PIDS technology can not only directly detect particles as small as 10 nm, but also directly detect multi peak distributions at the nanoscale.
The nano analysis function and micro analysis function are combined into one, which is powerful. The true 10nm measurement can make it used as an independent high-resolution nano particle analyzer.
The new generation solid-state laser light source does not require preheating and has a lifespan of over 70000 hours when turned on.
Parallel signal acquisition and transmission ensure high signal-to-noise ratio, no time difference, and high throughput of the signal.
Multi wavelength and polarized light analysis techniques provide high assurance for accurate analysis of particle size distribution over a wide dynamic range.
Multiple automated sample dispersion systems, "plug and play", can be switched in seconds, efficient and convenient.
The new generation touch screen is designed with ADAPT analysis software, which is more intuitive to operate without the need for operational experience. The measurement can be completed in three simple steps, and the intuitive and eye-catching navigation wheel only requires one step to achieve data display and export.
The ADAPT software automatically manages the measurement results in standard green or red color, and achieves direct quality control through automatic pass/fail management.
The software is equipped with a powerful optical parameter database and an innovative "Zero Time" real-time optical model system, which can establish new optical models in just one second and provide objective and accurate analysis reports.
The instrument is equipped with a self checking diagnostic function, which displays the measurement status at any time during the testing process.
Technical Specifications:
• Particle size range: 10 nanometers to 3500 micrometers (peak)
Main optical path laser source: solid-state laser connected by fiber optic connection
Detector: 132 independent physical angle detectors
Real analysis channels: 136
Multi wavelength measurement: 475nm, 613nm, 785nm, and 900nm
Optical theoretical model: full Mie theory; Fraunhofer theory
Accuracy error: less than+/-0.5%
Reproducibility error: less than+/-0.5%
Laser diffraction particle size analyzerApplication advantages:
Widely used in food additives, soil, sediment, adhesives, alloys, metal powders, pharmaceuticals, minerals, paper and other application fields.
• Large capacity, designed specifically for soil and sediment - standard sample stage - with a capacity of up to 1500mL, improving the representativeness, accuracy, and repeatability of widely distributed samples
√ Automatic intelligent cleaning, automatic liquid inlet and outlet, adjustable circulation speed
√ Built in sample ultrasonic treatment for stable and reliable dispersion
Ideal detection effect for fine particle components (clay particles, fine silt) and coarse particle components with low content, fully automatic operation is simple