Basic Configuration

·Brand and Model:Keysignt is a 26.5GHz network analyzer from DeTech

·Standard frequency range: 10 MHz to 26.5 GHz

·Port configuration: Supports multiple configurations, including:

·2-port (single signal source)

·4-port (dual signal source), supporting integrated balancing and frequency conversion device measurement

Performance indicators (based onDalian University of TechnologyEquipment data)

·Dynamic range (at test port): ≥ 140 dB (100 MHz -13.5 GHz)

·Directionality: ≥ 48 dB (10 MHz -26.5 GHz)

·Output power: ≥+19 dBm (10 MHz -10 GHz)

·Trajectory noise (amplitude): ≤ 0.00081 dB (100 MHz -24 GHz)

·Phase noise (10 kHz frequency offset): ≤ -137 dBc/Hz @ 1 GHz

Expansion capability

·Scalable frequency: Supports options to extend the frequency to the millimeter wave band of 60 GHz to 90 GHz.

·Application software: Provides a wide range of software options, supporting advanced measurements such as noise figure, gain compression, intermodulation distortion, mixer, time-domain/impedance (TDR), etc.

·Hardware options: Optional built-in pulse modulator, bias T-head, signal source/receiver attenuator, etc., to meet different testing needs.

Keysignt is a 26.5GHz network analyzer from DeTechMain application scenarios

Based on its powerful features, N5222B is mainly used for:

·Active/Passive Device Testing: Accurately measure the S-parameters, gains, losses, etc. of amplifiers, filters, antennas, couplers, and other devices.

·Frequency converter testing: Conduct comprehensive scalar and vector analysis on mixers and frequency converters.

·Signal integrity analysis: Especially for the N5222BT model, it is a complete solution that includes professional software (PLTS) and accessories, specifically designed to evaluate the signal integrity and impedance performance of high-speed cables, backplanes, connectors, BGA packages.

·Advanced feature analysis: Through software options, precise measurement of nonlinear characteristics such as noise figure, gain compression point (P1dB), third-order intermodulation point (TOI), and pulse RF of components can be achieved.

·Wafer level testing: It can be connected to a probe station to measure and model wafer level parameters of semiconductor chips, MEMS devices, etc.