- Phone
-
Address
Room 208, Building 5, No. 88 Rongbei Road, Songjiang District, Shanghai
Shanghai Zengjun Industrial Co., Ltd
Room 208, Building 5, No. 88 Rongbei Road, Songjiang District, Shanghai
Keithley 2400 Digital MultimeterIntroduction:
Keithley 2400 Digital MultimeterSingle channel source measurement unit, integrating voltage source, current source, voltmeter, ammeter, and ohmmeter functions, is a high-precision DC parameter tester. This device is designed specifically for testing the electrical properties of semiconductor devices, electronic components, and materials. It can synchronously output and accurately measure voltage and current, achieving bidirectional operation of four image limited sources/wells, replacing traditional multi instrument combinations, simplifying the testing system, and improving measurement accuracy and efficiency
2401. |
No |
1 |
1A |
20V |
1pA / 100nV |
20 W |
2400 |
No |
1 |
1A |
200V |
1pA / 100nV |
20 W |
2410. |
No |
1 |
1A |
1100V |
1pA / 100nV |
20 W |
2400 SourceMeter ® SMU instrument
in the past 25 Within the year,2400 The model has been used in research and development laboratories and production lines around the world. The main products in this industry provide solutions suitable for numerous applications200V @ 1A,20WPerformance.
Traditional products. Consider using updated in applications or designs 2450 Shape visualizationSourceMeterTo obtain longer-term investment returns.
20WHigh time performance200V/1A
0.012%Basic measurement accuracy, with 6Half bit resolution
2 Line4 line and 6 Remote LineVSource and Measurement Sensing
andKickStartCombined use of software
use 2400 typeSourceMeter®Production and testing of thermistor for instruments
Keithley 2400 SMU
2401 low costSourceMeter® SMUinstrument
2401 Type is an excellent foundation/entry-levelSMUSuitable for student education laboratories, research laboratories, and simple production testing applications. Solutions provided for various applications in various industries.
20WHigh time performance20V / 1A
0.012%Basic measurement accuracy, with 6Half bit resolution
Front and rear banana input/Output jack
andKickStartCombined use of software
Keithley 2401 SMU Front
2410 high voltageSourceMeter® SMUinstrument
Keithley 2410is a1000V,20WThe instruments used include resistance and voltage coefficient testing, varistors, and high-voltage diodes (including switches, voltage regulators, etc.)RFThe ideal choice for diodes and rectifiers.
Traditional products. Consider using the updated 2470 graphical 1100V SourceMeter in applications or designs to achieve longer-term investment returns.
Performance up to 1100V/1A at 20W
0.012%Basic measurement accuracy, with 6Half bit resolution
1pA / 100nVMeasurement resolution
andKickStartCombined use of software
Main features:
Integrating the functions of 5 instruments (IV source, IVR measurement)
6 modes: 20W~100W DC, 1000W pulse, 1100V~1 μ V, 10A~10pA
Source and trap (4 quadrants) operation
0.012% basic measurement accuracy (6-and-a-half bit resolution)
2-wire, 4-wire, and 6-wire remote voltage sources and measurement sensing
1700 readings per second (4 and a half bit resolution), via GPIB
Using/disabling comparator for quick sorting/sorting
Provide high-speed sensing line contact inspection function
Programmable DIO port for automation/processing programs/probe control
Standard SCPI GPIB, RS232, and Jishili trigger link interfaces
Jishili LabTracer 2.0 I-V Curve Tracking Application Software (Download)
Equipment:
Discrete semiconductor devices
passive component
Transient suppression device
IC、RFIC、MMIC
Laser diode, laser diode module LED、 Photodetector
Circuit protection devices: TVS, MOV, fuses, etc
airbag
Connectors, switches, relays
Testing:
electric leakage
Low voltage/resistance
LIV
IDDQ
I-V characteristic analysis
Isolation and printed line resistance
temperature coefficient
Forward voltage, reverse breakdown, leakage current
DC parameter testing
DC power supply
It's shrimp
Example of insulation withstand voltage test sequence
The advantages of compact integrated instruments
By connecting the source and measurement circuit in a single device, these instruments can provide a variety of systems that are superior to those constructed with individual sources and measurement instruments. For example, they greatly shorten the time required for testing station development, establishment, and maintenance, while reducing the overall cost of purchasing the system. By eliminating the complex synchronization and connection issues associated with using multiple instruments, they simplify the testing process itself. Moreover, the compact half rack size saves valuable "space" for testing racks or test benches.
Integrating 5 instrument functions (IV source, IVR measurement)
The precise coupling characteristics of source measuring instruments have many advantages over discrete instruments. For example, it has shorter testing time, reduces GPIB traffic, and simplifies remote programming interfaces. It also protects the tested equipment from damage in occasional overload, thermal runaway, and other situations. Both the current source and voltage source can be set to read back to ensure the integrity of the device measurement. If the read back reaches the limit of programmable tolerance, the source is clamped at this limit, providing error protection.
I-V characteristic analysis
All digital source tables provide 4-quadrant operation. Working in the first and third stages, serving as a power source to output power to the load. Work in the second and fourth pixels as a trap (load) to absorb energy. Voltage, current, and resistance can be measured during source or trap operation.


Automation to improve speed
Jishili digital source meters have improved the efficiency of production testing. It can measure while providing voltage or current sources without changing connections, making it suitable for reliable operation in uninterrupted production environments. In order to meet the throughput requirements for production applications, digital source meters have many built-in functions that enable them to run complex test sequences without the need for slower computer control or GPIB communication.
Standard scanning and customized scanning
The scanning scheme uses automated hooks to greatly accelerate testing. The three basic scanning waveforms can be set to single event or continuous operation, making them very suitable for I/V, I/R, V/L, and V/R characteristic analysis.
-Linear staircase scanning: using equal linear steps from the starting level to the ending level
-Logarithmic staircase scanning: Scanning in proportion to the specified number of steps per ten units
-Customized scanning: supports setting up dedicated scanning by specifying the number of measurement points and the output level of each point
-Up to 1700 readings per second (4 and a half bit resolution), to GPIB bus
-5000 readings can be stored in non-volatile buffer memory

Built in test sequencer (source memory list)
The source storage list provides faster and more convenient testing, allowing you to set up and execute up to 100 different tests without PC intervention.
-Store up to 100 instrument configurations, each containing source settings, measurement settings, pass/fail criteria, and more.
-Pass/fail limit test speed up to 500 μ s/test point
-The onboard comparator eliminates the delay that occurs when sending data to the computer for analysis
-Built in, user-defined mathematical functions are used to calculate and derive parameters

Digital I/O interface
The digital I/O interface can connect digital source tables to many popular component processing programs, including Aetrium, Aeco, and Robotronics. Other functions of this interface include:
Compact system integration for applications such as sorting and sorting
Built in component processing program interface
Test start and test end signals
5V, 300mA power supply
Optional extender accessory (2499-DIGIO type) adds 16 digital I/O lines
Trigger link interface
All digital source tables include Jishili's proprietary trigger link interface, which can establish high-speed and seamless communication with many Jishili and other instruments. For example, using trigger link interfaces to connect digital source meters and 7000 series switch systems to achieve a complete multi-point testing solution. During high-speed testing sequences independent of computers and GPIB, the 7000 series switch system can be controlled by a digital source meter by triggering the link.
Optional contact inspection function
Before the automatic testing sequence begins, the contact check function can quickly and easily verify whether the connection is good. This eliminates measurement errors and inaccurate product defects caused by contact fatigue, damage, contamination, looseness or connection interruption, relay failure, etc. Some of the performance features of this feature are as follows:
350 μ s verification and notification processing time
The output of the digital source meter automatically shuts down after an error and is reactivated after confirming good contact, thereby protecting the tested device from damage and protecting the controller from potential security threats.
3 pass/fail thresholds: 2 Ω, 15 Ω, and 50 Ω
During the working process, no energy passes through the tested device
Enable from the front panel or remotely via GPIB
3 fault notification methods

6-wire Ohmic circuit. Due to the high current protection, the voltage at both ends of R2 is 0V, so all test currents pass through R1.
Some 6-wire resistance measurement methods
The digital source meter can perform standard 4-wire, split Kelvin, and 6-wire, protected resistance measurements and can be configured as a constant current or constant voltage method. 6-line measurement method:
In addition to 4-wire sensing and source testing lines, protective and shielded sensing lines are also used.
Locking the parallel current path, when measuring the isolation of the tested component in a resistor bank or hybrid circuit
Allow users to easily configure and plot data using 2400 series source tables, enabling easy analysis of the characteristics of two, three, and four terminal devices
model |
range |
Set resolution |
power supply 1 |
Default measurement resolution |
measurement2, 3, 4Accuracy (1 year) 23 ° C ± 5 ° C ± (% rdg.+voltage) |
Output conversion rate (± 30%) |
Source/trap limit |
2400, 2401 |
200.000 mV |
5 µV |
0.02% + 600 µV |
1 µV |
0.012% + 300 µV |
±21 V @ ±1.05 A ±210 V @ ±105 mA* |
|
2.00000 V |
50 µV |
0.02% + 600 µV |
10 µV |
0.012% + 300 µV |
|||
20.0000 V |
500 µV |
0.02% + 2.4 mV |
100 µV |
0.015% + 1.5 mV |
0.08 V/µs |
||
200.000 V* |
5 mV |
0.02% + 24 mV |
1 mV |
0.015% + 10 mV |
0.5 V/µs |
||
2410 |
200.000 mV |
5 µV |
0.02% + 600 µV |
1 µV |
0.012% + 300 µV |
±21 V @ ±1.05 A ±1100 V @ ±21 mA |
|
2.00000 V |
50 µV |
0.02% + 600 µV |
10 µV |
0.012% + 300 µV |
|||
20.0000 V |
500 µV |
0.02% + 2.4 mV |
100 µV |
0.015% + 1 mV |
0.15 V/µs |
||
1000.00 V |
50 mV |
0.02% + 100 mV |
10 mV |
0.015% + 50 mV |
0.5 V/µs |
||
2420 |
200.000 mV |
5 µV |
0.02% + 600 µV |
1 µV |
0.012% + 300 µV |
±21 V @ ±3.15 A ±63 V @ ±1.05 A |
|
2.00000 V |
50 µV |
0.02% + 600 µV |
10 µV |
0.012% + 300 µV |
|||
20.0000 V |
500 µV |
0.02% + 2.4 mV |
100 µV |
0.015% + 1 mV |
0.08 V/µs |
||
60.0000 V |
1.5 mV |
0.02% + 7.2 mV |
1 mV |
0.015% + 3 mV |
0.14 V/µs |
||
2440 |
200.000 mV |
5 µV |
0.02% + 600 µV |
1 µV |
0.012% + 300 µV |
±10.5 V @ ±5.25 A ±42 V @ ±1.05 A |
|
2.00000 V |
50 µV |
0.02% + 600 µV |
10 µV |
0.012% + 300 µV |
|||
10.0000 V |
500 µV |
0.02% + 1.2 mV |
100 µV |
0.015% + 750 µV |
0.08 V/µs |
||
40.0000 V |
5 mV |
0.02% + 4.8 mV |
1 mV |
0.015% + 3 mV |
0.25 V/µs |
||
*Not available on 2401. | |||||||
NOTES
Temperature coefficient (0 ° C~18 ° C&28 ° C~50 ° C): ± (0.15 x specified accuracy)/° C.
Voltage regulation rate: Line regulation rate: 0.01% of the range. Load adjustment rate: 0.01% of the range+100 μ V.
Overvoltage protection: User selectable value, 5% allowable error. Factory default=none.
Current limit/clamp: The bipolar current limit (clamp) is set to a value. 0.1% of the range (minimum value).
Overshoot: Typical value<0.1% (full-scale step, resistive load, 10mA range).
Instantaneous response time: When the load undergoes a step change, the time for the output signal to recover to the specified value is 30 μ s (required).
Command processing time: The longest time required for the output to start changing after receiving the SOURce: VOLTage | CURRent command. Automatic range on: 10ms. Automatic range off: 7ms.
Output stabilization time: The time required to reach the final value of 0.1% after command processing and output conversion. 100 μ s (typical value). Resistive load. Range from 10 μ A to 100mA.
DC floating ground voltage: The output terminal can float up from the chassis ground level to ± 250VDC (± 40VDC for 2440 type).
Remote sensing: The voltage drop of each load line reaches 1V.
Embedding accuracy: Increase the range by 0.3% and the reading by ± 0.02% on the basic indicators.
Over temperature protection: If internal temperature overload is detected, the component will be put into standby mode.
Range change overshoot: overshoot to full resistive 100k Ω load, 10Hz~1MHz bandwidth, adjacent
Range: 100mV (typical value), except for 20V/200V (20V/60V for 2420), 20V/100V for 2425 and 2430, range boundary and 2440.
Minimum embedding value: 0.1% of the range.
Maximum duty cycle: 8%, hardware limitation, only 10A range. All other ranges are 100%.
Maximum pulse width: 5ms from 90% rising edge to 90% falling edge, 2.5ms 10A range.
Minimum pulse width: 150 μ s.
Minimum pulse resolution: 50 μ s (typical value), 70 μ s (maximum value) limited by system jitter.
Source accuracy: determined by the stability time and source range indicators.
Output stabilization time 0.1%:
800 μ s (typical value), current source=10A to 10 Ω, limited by voltage conversion rate.
500 μ s (typical value), current source=10A to 1 Ω, limited by voltage conversion rate.
Output conversion rate:
Voltage (10 Ω load): 0.25V/μ s ± 30% within the 100V range. 0.08V/μ s ± 30% in 20V range and 10A range.
Current (0 Ω load): 0.25A/s ± 30% in the 100V range. 0.08A/μ s ± 30% in 20V range and 10A range.
Only 2400 and 2410: The indicator is effective for continuous output currents below 105mA. For continuous operation exceeding 105mA
In 1 minute, the accuracy decreases by 10%/35mA (higher than 105mA).
2. Speed=Normal (1PLC). For a 0.1PLC, increase the range compensation index by 0.005%, except for the 200mV, 1A, and 10A ranges, which increase by 0.05%. For a 0.01PLC, increasing the range compensation index by 0.05%, except for a 0.5% increase in the range of 200mV, 1A, and 10A.
When correctly zeroed, the accuracy is applicable to 2-wire or 4-wire modes.
4. In pulse mode, limited to 0.1 PLC measurement.
model |
range |
Set resolution |
power supply1, 3Accuracy (1 year) 23 ° C ± 5 ° C ± (% rdg.+voltage) |
Default measurement resolution |
measurement5, 6, 7Accuracy (1 year) 23 ° C ± 5 ° C ± (% rdg.+voltage) |
Source/trap limit |
2400, 2401 |
1.00000 µA |
50 pA |
0.035% + 600 pA |
10 pA |
0.029% + 300 pA |
±1.05A @ ±21 V ±105 mA @ ±210 V8 |
10.0000 µA |
500 pA |
0.033% + 2 nA |
100 pA |
0.027% + 700 pA |
||
100.000 µA |
5 nA |
0.031% + 20 nA |
1 nA |
0.025% + 6 nA |
||
1.00000 mA |
50 nA |
0.034% + 200 nA |
10 nA |
0.027% + 60 nA |
||
10.0000 mA |
500 nA |
0.045% + 2 µA |
100 nA |
0.035% + 600 nA |
||
100.000 mA |
5 µA |
0.066% + 20 µA |
1 µA |
0.055% + 6 µA |
||
1.00000 A2 |
50 µA |
0.27 % + 900 µA |
10 µA |
0.22 % + 570 µA |
||
2410 |
1.00000 µA |
50 pA |
0.035% + 600 pA |
10 pA |
0.029% + 300 pA |
±1.05A @ ±21 V ±21 mA @ ±1100 V |
10.0000 µA |
500 pA |
0.033% + 2 nA |
100 pA |
0.027% + 700 pA |
||
100.000 µA |
5 nA |
0.031% + 20 nA |
1 nA |
0.025% + 6 nA |
||
1.00000 mA |
50 nA |
0.034% + 200 nA |
10 nA |
0.027% + 60 nA |
||
20.0000 mA |
500 nA |
0.045% + 4 µA |
100 nA |
0.035% + 1.2 µA |
||
100.000 mA |
5 µA |
0.066% + 20 µA |
1 µA |
0.055% + 6 µA |
||
1.00000 A2 |
50 µA |
0.27 % + 900 µA |
10 µA |
0.22 % + 570 µA |
||
2420 |
10.0000 µA |
500 pA |
0.033% + 2 nA |
100 pA |
0.027% + 700 pA |
±3.15A @ ±21 V ±1.05 A @ ±63 V |
100.000 µA |
5 nA |
0.031% + 20 nA |
1 nA |
0.025% + 6 nA |
||
1.00000 mA |
50 nA |
0.034% + 200 nA |
10 nA |
0.027% + 60 nA |
||
10.0000 mA |
500 nA |
0.045% + 2 µA |
100 nA |
0.035% + 600 nA |
||
100.000 mA |
5 µA |
0.066% + 20 µA |
1 µA |
0.055% + 6 µA |
||
1.00000 A2 |
50 µA |
0.067% + 900 µA |
10 µA |
0.066% + 570 µA |
||
3.00000 A2 |
50 µA |
0.059% + 2.7 mA |
10 µA |
0.052% + 1.71 mA |
||
2440 |
10.0000 µA |
500 pA |
0.033% + 2 nA |
100 pA |
0.027% + 700 pA |
±5.25A @ ±10.5 V ±1.05 A @ ±42 V |
100.000 µA |
5 nA |
0.031% + 20 nA |
1 nA |
0.025% + 6 nA |
||
1.00000 mA |
50 nA |
0.034% + 200 nA |
10 nA |
0.027% + 60 nA |
||
10.0000 mA |
500 nA |
0.045% + 2 µA |
100 nA |
0.035% + 600 nA |
||
100.000 mA |
5 µA |
0.066% + 20 µA |
1 µA |
0.055% + 6 µA |
||
1.00000 A |
50 µA |
0.067% + 900 µA |
10 µA |
0.060% + 570 µA |
||
5.00000 A |
50 µA |
0.10 % + 5.4 mA |
10 µA |
0.10 % + 3.42 mA |
NOTES
Temperature coefficient (0 ° C~18 ° C&28 ° C~50 ° C): ± (0.15 x specified accuracy)/° C.
Current regulation rate: Line regulation rate: 0.01% of the range. Load adjustment rate: 0.01% of the range (except for 0.05% of the 2440 5A range)+100pA.
Voltage limit/embedding: The bipolar voltage limit (embedding) is set to a value. 0.1% of the range (minimum value).
Overshoot: Typical value<0.1% (1mA step size, RL=10k Ω, 20V range, suitable for 2400, 2410, 2420, 2425, 2430), (10V range, for 2440).
Only 2400 and 2410: The indicator is effective for continuous output currents below 105mA. For continuous operation above 105mA for more than 1 minute, the accuracy decreases by 10%/35mA (above 105mA).
2. Full operation (1A) without considering load up to 30 ° C (50 ° C for 2420 and 2440). If the ambient temperature is above 30 ° C (50 ° C for 2420 and 2440), reduce the load by 35mA/° C and distribute a 35mA/Ω load. 4-wire mode. For current traps operating in the 1A, 3A, or 5A range, the maximum continuous power is limited to approximately 1/2 of the rated power or lower, depending on the current, up to an ambient temperature of 30 ° C. Refer to the power formula in the user manual to calculate the allowable duty cycle under specific conditions.
For trap mode, with a range of 1 μ A~100mA, the accuracy is: 2400: ± (0.15%+offset * 4), 2410, 2420, 2425, 2430, 2440: ± (0.5%+offset * 3).
For the 1A range, the accuracy is: 2400: ± (1.5%+offset * 8), 2410, 2420, 2425, 2430, 2440: ± (1.5%+offset * 3)
The range of 4.10A can only be achieved in pulse mode. Limit to the maximum pulse width of 2.5ms. Maximum duty cycle of 10%.
5. Speed=Normal (1PLC). For a 0.1PLC, increasing the range compensation index by 0.005%, except for a 0.05% increase in the range of 200mV, 1A, and 10A. For a 0.01PLC, increasing the range compensation index by 0.05%, except for a 0.5% increase in the range of 200mV, 1A, and 10A.
When correctly zeroed, the accuracy is applicable to 2-wire or 4-wire modes.
7. In pulse mode, limited to 0.1 PLC measurement.
Only 2400 and 2400-C are available.
range |
Default Resolution |
Default test current 2400, 2401, 2410 |
Default test current |
Standard accuracy (23 ° C ± 5 ° C) for 1 year, ± (% rdg.+current) |
Enhanced accuracy (23 ° C ± 5 ° C)41 year, ± (% rdg.+resistance) |
||
2400, 2401 |
2410 |
2420, 2440 |
2400, 2401 |
||||
<0.20000 W3 |
– |
– |
– |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
2.00000 W3 |
10 µW |
– |
1 A |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
0.17% + 0.0003 W |
Source IACC + Meas. VACC |
20.0000 W |
100 µW |
100 mA |
100 mA |
0.10% + 0.003 W |
0.11% + 0.006 W |
0.10% + 0.003 W |
0.07% + 0.001 W |
200.000 W |
1 mW |
10 mA |
10 mA |
0.08% + 0.03 W |
0.09% + 0.1 W |
0.08% + 0.03 W |
0.05% + 0.01 W |
2.00000 kW |
10 mW |
1 mA |
1 mA |
0.07% + 0.3 W |
0.08% + 0.6 W |
0.07% + 0.3 W |
0.05% + 0.1 W |
20.0000 kW |
100 mW |
100 µA |
100 µA |
0.06% + 3 W |
0.07% + 6 W |
0.06% + 3 W |
0.04% + 1 W |
200.000 kW |
1 W |
10 µA |
10 µA |
0.07% + 30 W |
0.07% + 60 W |
0.07% + 30 W |
0.05% + 10 W |
2.00000 MW6 |
10 W |
1 µA |
1 µA |
0.11% + 300 W |
0.12% + 600 W |
0.11% + 300 W |
0.05% + 100 W |
20.0000 MW7 |
100 W |
1 µA |
1 µA |
0.11% + 1 kW |
0.12% + 2.4 kW |
0.11% + 1 kW |
0.05% + 500 W |
200.000 MW3 |
1 kW |
100 nA |
– |
0.66% + 10 kW |
0.66% + 24 kW |
Source IACC + Meas. VACC |
0.35% + 5 kW |
>200.000 MW3 |
– |
– |
– |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
Source IACC + Meas. VACC |
Temperature coefficient (0 ° C~18 ° C&28 ° C~50 ° C): ± (0.15 x specified accuracy)/° C.
Current source mode, manual resistance: total uncertainty=current source accuracy+voltage measurement accuracy (4-wire remote sensing).
Voltage source mode, manual resistance: total uncertainty=voltage source accuracy+current measurement accuracy (4-wire remote sensing).
6-wire resistance mode: supports the use of active resistance protection and protection sensing. Protective output
Maximum current: 50mA (excluding 1A range). Accuracy depends on the load. Please refer to No. 2033 for the calculation formula.
Protection output impedance:<0.1 Ω, resistance mode.
annotation
1. Speed=Normal (1 PLC). For a 0.1 PLC, increasing the range compensation index by 0.005%, except for a 0.05% increase in the range of 200mV, 1A, and 10A. For a 0.01 PLC, increasing the range compensation index by 0.05%, except for a 0.5% increase in the range of 200mV, 1A, and 10A.
When correctly zeroed, the accuracy is applicable to 2-wire or 4-wire modes.
3. Only manual resistors - except for 2420, 2425, 2430, 2440 for 2 Ω range and 2410 or 2400 for 200M Ω range.
4. Activate source read back and enable offset compensation. And 2410, 2420, 2425, 2430, and 2440 also provide similar accuracy enhancements.
5. In pulse mode, limited to 0.1 PLC measurement.
6. Except for 2440; The default test current is 5 μ A.
7. Except for 2440; The default test current is 0.5 μ A.
Maximum range change rate: 75/s
Maximum automatic range measurement time: 40ms (fixed source).
speed |
NPLC/Trigger Source |
measurement |
Source - Measurement |
Source - Measurement5Through failure testing4, 5 |
Source - Memory4 |
||||||||||||
To memory |
To GPIB |
To memory |
To GPIB |
To memory |
To GPIB |
To memory |
To GPIB |
||||||||||
Fast |
0.01 / internal |
2081 |
(2030) |
1754 |
1551 |
(1515) |
1369 |
902 |
(900) |
981 |
165 |
(162) |
165 |
||||
IEEE-488.1 Mode |
0.01 / external |
1239 |
(1200) |
1254 |
1018 |
(990) |
1035 |
830 |
(830) |
886 |
163 |
(160) |
163 |
||||
Fast |
0.01 / internal |
2081 |
(2030) |
1198 |
(1210) |
1551 |
(1515) |
1000 |
(900) |
902 |
(900) |
809 |
(840) |
165 |
(162) |
164 |
(162) |
IEEE-488.2 Mode |
0.01 / external |
1239 |
(1200) |
1079 |
(1050) |
1018 |
(990) |
916 |
(835) |
830 |
(830) |
756 |
(780) |
163 |
(160) |
162 |
(160) |
Medium |
0.10 / internal |
510 |
(433) |
509 |
(433) |
470 |
(405) |
470 |
(410) |
389 |
(343) |
388 |
(343) |
133 |
(126) |
132 |
(126) |
IEEE-488.2 Mode |
0.10 / external |
438 |
(380) |
438 |
(380) |
409 |
(360) |
409 |
(365) |
374 |
(333) |
374 |
(333) |
131 |
(125) |
131 |
(125) |
standard |
1.00 / internal |
59 |
(49) |
59 |
(49) |
58 |
(48) |
58 |
(48) |
56 |
(47) |
56 |
(47) |
44 |
(38) |
44 |
(38) |
IEEE-488.2 Mode |
1.00 / external |
57 |
(48) |
57 |
(48) |
57 |
(48) |
57 |
(47) |
56 |
(47) |
56 |
(47) |
44 |
(38) |
44 |
(38) |
speed |
NPLC/Trigger Source |
Measure to GPIB |
Source - Measurement5 To GPIB |
Source - Measurement5 Through failure testing4, 5To GPIB |
|||
Fast (488.1) |
0.01 / internal |
537 |
140 |
135 |
|||
Fast (488.2) |
0.01 / internal |
256 |
(256) |
79 |
(83) |
79 |
(83) |
Medium (488.2) |
0.10 / internal |
167 |
(166) |
72 |
(70) |
69 |
(70) |
Standard (488.2) |
1.00 / internal |
49 |
(42) |
34 |
(31) |
35 |
(30) |
speed |
NPLC/Trigger Source |
Measure to GPIB |
Source passed failure test |
Source measurement passed failure test5, 7To GPIB |
|||
Fast |
0.01 / external |
1.04 ms |
(1.08 ms) |
0.5 ms |
(0.5 ms) |
4.82 ms |
(5.3 ms) |
Medium |
0.10 / external |
2.55 ms |
(2.9 ms) |
0.5 ms |
(0.5 ms) |
6.27 ms |
(7.1 ms) |
standard |
1.00 / external |
17.53 ms |
(20.9 ms) |
0.5 ms |
(0.5 ms) |
21.31 ms |
(25.0 ms) |
NOTES
The reading rate can be used for voltage or current measurement. Turn off self stabilizing zero, turn off automatic range, turn off filter, turn off display, trigger delay=0, and use binary reading format.
2 pure resistive wires. The range of 1 μ A and 10 μ A is less than 65ms.
The characteristic of scanning 3000 points is to output within a fixed range.
4. Conduct pass/fail testing using upper and mathematical lower limits.
5 includes the time to reset the source to a new level before taking measurements.
The time from the falling edge of the START OF TEST signal to the falling edge of the END OF TEST signal.
7 does not include commands: SOURce: VOLTage | CURRent: TRIGgered
Noise suppression:
NPLC |
NMRR |
CMRR |
|
Fast |
0.01 |
— |
80 dB |
Medium |
0.1 |
— |
80 dB |
Slow |
1 |
60 dB |
100 dB1 |
1 Except for two current ranges of 90dB. | |||
Load impedance: Stabilize to 20000pF (typical value).
Common mode voltage: 250V DC (2440 is 40VDC).
Common mode isolation:>109Ω,<1000pF。
Over range: 105% of the range, source and measurement.
Maximum voltage drop between input/output and measurement terminal: 5V.
Maximum resistance of sensing line: 1M Ω, rated accuracy.
Sensing input impedance:>1010Oh.
Protection bias voltage:<150 μ V, typical value (300 μ V for 2430 and 2440).
Source output mode:
Pulse (only 2430 type)
Fixed DC level
Memory List (Mixed Function)
Ladder scanning (linear and logarithmic)
Memory buffer: 5000 readings/second @ 5-bit resolution (2 2500 point buffers). Include the selected measurement values and timestamps. Lithium battery backup (battery life exceeding 3 years)
Source storage list: 100 points (maximum).
Programmable: IEEE-488 (SCPI-1995.0), RS-232, 5 user-defined power on states plus factory default settings and * RST.
Digital interface:
Interlock: Low level input is valid:
Process program interface: Test start, test end, 3 types of bits+ 5V@300mA Power Supply.
Digital I/O: 1 trigger input, 4 TTL/relay drive output( 33V@500mA Diode clamp).
Power supply: 100V-240Vrms, 50Hz-60Hz (automatically detected when powered on).
2400:190VA。 2410:210VA。
2420:220VA。 2425,2430:250VA。 2440:240VA。
Heat dissipation: (2410, 2420, 2425, 2430, 2440): forced air, variable speed.
EMC: Compliant with EU Directive 89/336/EEC, EN 61326-1.
Safety: Compliant with EU Directive 73/23/EEC, EN61010-1.
Vibration: MIL-PRF-28800F Class 3 random vibration.
Preheating time: 1 hour to achieve rated accuracy.
Specification: 89mm high x 213mm wide x 370mm deep (3 1/2 in x 8 3/8 in x 14 9/16 in). Benchmark configuration (with handle&feet): 104mm high x 238mm wide x 370mm deep (4 1/8 in x 9 3/8 in x 14 9/16 in).
Weight: 3.21kg (7.08 pounds) (2425, 2430, 2440 weight: 4.1kg, 9.0 pounds).
Working environment: Working conditions range from 0 ° C to 50 ° C, with a relative humidity of 70% to 35 ° C. Reduce R.H./° C by 3%, with a temperature range of 35 ° C to 50 ° C.
Storage conditions: -25 ° C~65 ° C.