Jilun Electronics FS800 Semiconductor Parameter Analyzer

Jilun Electronics FS800 Semiconductor Parameter AnalyzerIntroduction:

The FS800 device parameter analyzer is a new generation of semiconductor device electrical characteristic analysis equipment from Kenlun Electronics. It has the characteristics of comprehensive functionality and flexible configuration. It can achieve current and voltage (IV) testing, capacitance voltage (CV) testing, fast waveform generation and testing, low-frequency noise testing, and high-speed time-domain signal acquisition in one device. It can be widely used in the research of new materials and new devices, electrical parameter testing, device model data testing, reliability testing, and other fields.

The device features an intuitive 18.5-inch touchscreen interface, utilizing self-developed testing hardware architecture and data bus. The efficient and scalable semiconductor characterization system host can be equipped with up to 24 self-developed high-precision SMUs or 132 channel low leakage matrix switches. At the same time, fast waveform generation and testing kits and high-precision LCR modules can be selected based on needs, providing various wafer level electrical parameter automation testing solutions through a single device. The LabExpress testing software built into the instrument is equipped with a rich library of built-in testing algorithms, which can efficiently coordinate the control of conceptual testing equipment, third-party instruments, semi-automatic and fully automatic probe stations, and other devices.

The comprehensive and flexible testing and analysis capabilities of FS800 can greatly accelerate the development and evaluation process of semiconductor devices and processes, meeting the testing needs of various semiconductor laboratories and production lines.

Application fields:

•CMOSparameter test

- MOSFETandBJTTransistor parameter testing

-Diodes andPNParameter testing

- MEMSTesting of sensor parameters

New material and device parameter testing

-Thin film transistor and display device parameter testing

-Two dimensional material and photodetector parameter testing

-Non volatile memory and material parameter testing

-Parameter testing of neuromorphic devices, memristors, and other devices

-Parameter testing of flexible electronic devices and wearable electronic devices

• Analysis of semiconductor device characteristics

• Modeling of semiconductor devices

• Reliability testing of semiconductor devices

• Production line testing

Efficient and scalable hardware platform

-Independently developed testing hardware architecture and data bus

-Can support up to 24 aSMU, or 132 Matrix switch for channels

-Can support both simultaneouslySMUImplement wafer fabrication in a single desktop device using matrix switch modules

Automated testing of electrical parameters

-Support multi-channel parallel testing and multi-point parallel testing

-scalableGPIBinterface

-scalablePXIchassis

•FS810high precisionSMU

- 0.1fAhigh resolution

-The highest current testing accuracy can reach15fA

-Maximum Voltage200V, maximum current1A, maximum DC power20W

- 1.5MS/sTime domain signal acquisition with sampling rate

•FS821Low leakage matrix switch output module

- 12Three coaxial output interfaces

- 200VLoad voltage,1Aload current

- 100fAOffset current

- 30MHzbandwidth

•FK401BFast waveform generation and testing kit

- 2A fast oneIVChannel, maximum voltage10V, maximum current10mA

- 100MS/sHigh speed time-domain signal acquisition with sampling rate

-Fast pulseIVTest, minimum pulse width130ns

-supportSMUthrough

-Can be expanded up to the maximum 5 A module（10 通道）

•FS338/FS339high precisionLCRmodule

- 40VDC bias voltage range

- FS338Bandwidth:20Hz~2MHz

- FS339Bandwidth:20Hz~10MHz