In situ XAFS testing device for gas-solid phase high-temperature reaction

In situ XAFS testing device for gas-solid phase high-temperature reactionParameters;

1. The device can switch between synchrotron X-ray fluorescence testing mode and transmission testing mode;

2. The device includes a temperature controller, an in-situ tank chamber, a heating system, and upper computer software;

3. The device adopts PID intelligent control, USB signal transmission, temperature curve data acquisition, which can be stored and retrieved;

4. Multi point temperature control calibration, temperature limit setting, temperature can be set in multiple program segments;

5. Temperature range: normal temperature -800 ℃, temperature control accuracy less than 0.5 ℃, heating rate: 80 ℃/min;

6. The device adopts resistance heating, and the sensor is placed below the sample, which can intuitively reflect the true temperature changes of the sample;

7. Sample diameter 11mm (customizable), window diameter 30mm;

8. The device window is made of polyimide, which has low signal loss and is non-toxic;

9. The device adopts O-ring sealing, which is well sealed, can be evacuated, and can be filled with reaction gas;

10. The device is made of aviation aluminum material, with an external shape of 90mm * 66mm * 30mm and a net weight of less than 0.5Kg;

11. Chamber cooling method: using circulating water cooling;

12. The in-situ XAFS testing device for gas-solid phase high-temperature reaction is easy to operate, easy to install, and has good testing consistency.