Controllable high-temperature in-situ X-ray testing platform

The controllable high-temperature in-situ X-ray testing platform is a scientific research equipment that integrates high-temperature control and X-ray diffraction analysis functions. Suitable for qualitative and quantitative analysis of crystal material phases, indexing of diffraction spectra and determination of lattice parameters, determination of grain size and lattice distortion, determination of thin film phases, and dynamic analysis of in-situ high-temperature structural changes.

1、 Product Overview:

Controllable high-temperature in-situ X-ray testing platformMainly used for studying the structural changes and performance of materials in high-temperature environments, it is suitable for qualitative and quantitative analysis of crystal material phases, indexing of diffraction spectra and determination of lattice parameters, determination of grain size and lattice distortion, determination of thin film phases, and dynamic analysis of in-situ high-temperature structural changes. Through this device, researchers can directly observe the structural evolution of materials at high temperatures without damaging the sample, providing strong support for research in materials science, chemistry, physics, and other fields.

2、 Device parameters:

1. The device includes a temperature controller, an in-situ tank chamber, a heating system, upper computer software, and a vacuum system;

2. The device adopts PID intelligent control, USB signal transmission, temperature curve data acquisition, which can be stored and retrieved;

3. Multi point temperature control calibration, temperature limit setting, temperature can be set in multiple program segments;

4. Temperature range: normal temperature -1000 ℃, temperature control accuracy less than 0.3 ℃, heating rate: 80 ℃/min;

5. The device adopts resistance heating, and the sensor is placed below the sample, which can intuitively reflect the true temperature changes of the sample;

6. The diameter of the heating platform is 25mm, the window adopts a hemispherical structure, and the plane is 360 ° unobstructed for collection. It is made of imported PEEK material;

7. The device adopts O-ring sealing, which is well sealed, can be evacuated, and can be filled with reaction gas;

8. The device is made of aviation aluminum material, with an outer shape of 110mm * 80mm * 50mm and a net weight of 0.5Kg;

9.Chamber cooling method: using circulating water cooling;

10.Device Simple operation, easy installation, and good testing consistency;

11. The device is widely used in major mainstream diffraction instrument brands and synchrotron radiation, without the need for instrument modification.

3、 Application areas:

Controllable high-temperature in-situ X-ray testing platformWidely used in research in materials science, chemistry, physics, and other fields, especially in studying the structural changes, performance, and reaction mechanisms of materials at high temperatures, it is of great significance.

In summary, it is a powerful, easy to operate and maintain scientific research equipment that provides strong support for research in materials science, chemistry, physics and other fields.